Electron-Density Dependence of Longitudinal-Optical Phonon Lifetime in Inn Studied by Subpicosecond Time-Resolved Raman Spectroscopy

K. T. Tsen,Juliann G. Kiang,D. K. Ferry,Hai Lu,William J. Schaff,Hon-Way Lin,Shangjr Gwo
DOI: https://doi.org/10.1088/0953-8984/19/23/236219
2007-01-01
Abstract:Subpicosecond time- resolved Raman spectroscopy has been used to measure the lifetime of the A(1)( LO) and E-1( LO) phonon modes in InN at T = 10 K for photoexcited electron - hole pair density ranging from 5 x 10(17) to 2 x 10(19) cm(-3). The lifetime has been found to decrease from 2.2 ps at the lowest density to 0.25 ps at the highest density. Our experimental findings demonstrate that the carrier- density dependence of LO phonon lifetime is a universal phenomenon in polar semiconductors.
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