Twinning Rotation and Ferroelectric Behavior of Epitaxial Bifeo3 (001) Thin Film

Huajun Liu,Ping Yang,Kui Yao,John Wang
DOI: https://doi.org/10.1063/1.3276543
IF: 4
2010-01-01
Applied Physics Letters
Abstract:A twinning rotation structure is revealed by reciprocal space mappings obtained from synchrotron X-ray diffraction for the epitaxial BiFeO3 thin film that was grown on (001) SrTiO3 substrate. The lattice strain is not fully relaxed at a film thickness of 720 nm. The structure is indexed as a monoclinic with lattice parameters a=5.610(1) Å, b=5.529(1) Å, c=4.031(1) Å, and β=89.34(1)°. The twinning rotation leads to an enhanced remanent polarization (2Pr=164 μC/cm2, 2Ec=510 kV/cm) and greatly reduced leakage current density of 1.2×10−6 A/cm2 at 100 kV/cm.
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