Strain-induced Polarization Rotation in Epitaxial (001) BiFeO3 Thin Films.

D. A. Felker
DOI: https://doi.org/10.1103/physrevlett.101.107602
IF: 8.6
2008-01-01
Physical Review Letters
Abstract:Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.
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