TEM Characterisation of YNi2B2C Thin Film Microstructure

G.H. Cao,P. Simon,W. Skrotzki,S.C. Wimbush,B. Holzapfel
DOI: https://doi.org/10.1007/s00339-004-2768-x
2004-01-01
Applied Physics A
Abstract:A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.
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