Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an Yni2b2c Thin Film

GH Cao,W Skrotzki,P Simon,SC Wimbush,B Holzapfel
DOI: https://doi.org/10.1021/cm050006t
IF: 10.508
2005-01-01
Chemistry of Materials
Abstract:An YNi 2 B 2 C thin film grown on a MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM). Planview TEM analyses show that the film consists of isolated rectangular YNi 2 B 2 C grains distributed within a second phase. This phase was identified as monoclinic Y 2 Ni 1 5 B 6 with lattice parameters a = 1.42 nm, b = 1.07 nm, c = 0.96 nm, and β = 95°. Within the YNi 2 B 2 C grains, a hexagonal Y 0 . 9 1 5 Ni 4 . 1 2 B phase with lattice parameters a = 1.49 nm and c = 0.69 nm is intergrown with a cubic Y 2 O 3 phase with lattice parameter a = 1.06 nm. The orientation relationships between YNi 2 B 2 C, Y 2 O 3 , and Y 0 . 9 1 5 Ni 4 . 1 2 B are analyzed, and the mechanisms of phase formation are discussed.
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