Tem Study of Microstructure of Yba2cu3oy Bicrystal Grain Boundary Junctions Grown on Y2o3 Stabilized Zro2 Bicrystal

DP Yu,XD Hu,YZ Wang,YD Dai,SG Wang,LP You,ZQ Liu,Z Zhang

DOI: https://doi.org/10.1016/s0921-4534(97)01318-x

1997-01-01

Abstract:The microstructure details of bicrystal boundaries of both the YBa2Cu3Oy thin film and the ZrO2 bicrystals substrate were studied by means of transmission electron microscopy (TEM).

What problem does this paper attempt to address?

TEM STUDY OF THE MICROSTRUCTURE AND INTERFACES IN YBa2Cu3Oy THIN FILMS GROWN ON SILICON WITH A Eu2CuO4/Y-ZrO2 BI-LAYER BUFFER

J. GAO,E. G. FU,Z. LUO,Z. WANG,D. P. YU

DOI: https://doi.org/10.1142/S0218625X07010196

2007-01-01

Surface Review and Letters

Abstract:The microstructures in the YBa2Cu3Oy films grown on Eu2CuO4/Y-ZrO2(YSZ) buffered silicon were studied by means of transmission electron microscopy. Our effort was emphasized on the influence of the interfacial microstructures on the formation and epitaxy of the grown layer. It was found that a native Si-oxide layer similar to 5 nm was formed at the boundary between YSZ and silicon. Such an intermediate layer should be formed after the initial formation of the grown YSZ layer as the epitaxy of YSZ still remain. The epitaxy can be kept through all layers without the formation of big grain boundaries. No amorphous layers and secondary phases were observed at the interfaces of YSZ/ECO and YBCO/ECO. The results demonstrate that the crystallinity and the epitaxy of YBCO have been greatly improved by the bi-layer buffer.
TEM STUDY OF THE MICROSTRUCTURE AND INTERFACES IN YBa2Cu3Oy THIN FILMS GROWN ON SILICON WITH A Eu2CuO4/Y-ZrO2 BI-LAYER BUFFER

J. GAO,E. G. FU,Z. LUO,Z. WANG,D. P. YU

DOI: https://doi.org/10.1142/s0218625x07010196

2007-01-01

Surface Review and Letters

Abstract:The microstructures in the YBa 2 Cu 3 O y films grown on Eu 2 CuO 4/ Y-ZrO 2(YSZ) buffered silicon were studied by means of transmission electron microscopy. Our effort was emphasized on the influence of the interfacial microstructures on the formation and epitaxy of the grown layer. It was found that a native Si -oxide layer ~ 5 nm was formed at the boundary between YSZ and silicon. Such an intermediate layer should be formed after the initial formation of the grown YSZ layer as the epitaxy of YSZ still remain. The epitaxy can be kept through all layers without the formation of big grain boundaries. No amorphous layers and secondary phases were observed at the interfaces of YSZ/ECO and YBCO/ECO. The results demonstrate that the crystallinity and the epitaxy of YBCO have been greatly improved by the bi-layer buffer.
Microscopic Structure of SrTiO3 Bicrystal Boundaries Studied with Scanning Tunneling and Atomic Force Microscopy

QD Jiang,ZJ Huang,A Brazdeikis,M Dezaneti,CL Chen,P Jin,CW Chu,J Zegenhagen

DOI: https://doi.org/10.1016/s0921-5107(98)00247-5

1998-01-01

Abstract:We studied the thermal annealing effects on the microstructure of the grain boundary of a 36.8° and a 24° symmetric [100] tilt SrTiO3 bicrystal. Scanning tunneling microscopy and atomic force microscopy were used for the observation of the vacuum exposed boundary structures. Annealing the bicrystalline substrates at temperatures as low as 780°C led to the formation of grooves at their boundaries. This provides direct evidence that the thickness depression of YBa2Cu3O7−δ films at the bicrystal boundaries originates from the underlying grooved substrates. A simple structural model has been proposed to explain the 1/θ dependence of the normalized critical currents flowing cross the grain boundaries. PACS nos: 61.16.Ch, 61.72.Mm, 68.35.-p, 68.35.Ct, 68.35.
Microstructures of YBa1.85Eu0.15Cu3O7− Superconducting Films Grown on SrTiO3 and YSZ Substrates

Qiyun Xie,Mingqiang Gu,Bin Qian,Xiaoshan Wu,Zhengsheng Jiang,Jin Zou,Ju Gao

DOI: https://doi.org/10.1016/j.jcrysgro.2010.09.060

IF: 1.8

2011-01-01

Journal of Crystal Growth

Abstract:A detailed atomic scale microstructure analysis of Eu-doped YBa1.85Eu0.15Cu3O7−δ (YEBCO) thin films with 100nm in thickness has been carried out by a combination of scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Interesting regular-like arranged network of nanoscale undulations is observed on the surface of YEBCO film on (001) SrTiO3 substrate. TEM image clearly indicates that the film is always c-axis oriented, but lots of natural precipitates of Y2O3 are involved both at the interface and deep in the film. Desirable size and number density of Y2O3 are thought to be important for acting as efficient flux pinning centers. In the case of YEBCO film on (001) yttrium stabilized ZrO2 (YSZ) substrate, few cracks and outgrowths appear due to much larger lattice mismatch and dissimilar crystal structure between the film and substrate, but surface quality is still much better compared to the parent YBaCu3O7−δ film. Besides, highly textured BaZrO3 layer at the interface and a-axis grains with small dimensions in the film are formed. Interface stability of two kinds of films studied, namely YEBCO/STO and YEBCO/YSZ, is also assessed comprehensively by first principle calculations.
Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2

Cuixiu Liu,Xiumei Chen,Yong Wang,MingChun Xu,Guangming Luo,Zhenhong Mai,Weihua Tang,Ju Gao,Quanjie Jia,Wenli Zheng,Zhong Chen

DOI: https://doi.org/10.1016/S0040-6090(03)00589-3

IF: 2.1

2003-01-01

Thin Solid Films

Abstract:By using Eu2CuO4 (ECO) as a buffer layer, extremely smooth surface YBa2Cu3O7−x (YBCO) thin film on yttrium stabilized ZrO2 substrates was obtained. The microstructure of YBCO thin films with or without ECO buffer layer were studied by atomic force microscopy, scanning electron microscopy and X-ray techniques. It was found that the epitaxy and crystallinity and surface of the YBCO thin films have been significantly enhanced with ECO buffer layer.
Nondestructive Investigation of Microstructures and Defects at a SrTiO3 Bicrystal Boundary

QD Jiang,ZJ Huang,A Brazdeikis,M Dezaneti,CL Chen,P Jin,CW Chu

DOI: https://doi.org/10.1063/1.121605

IF: 4

1998-01-01

Applied Physics Letters

Abstract:The effects of thermal annealing on the microstructure at the grain boundary of a 36.8° symmetric [100] tilt SrTiO3 bicrystal were studied. Scanning tunneling microscopy and atomic force microscopy were used for nondestructive observation of the boundary structures. Annealing the bicrystalline substrates at temperatures as low as 780 °C led to the formation of grooves at their boundaries. This provides direct evidence that the thickness depression of YBa2Cu3O7−δ films at the bicrystal boundaries originates from the underlying grooved substrates. Defects characterized as holes with diameters ranging from ∼30 nm to ∼200 nm were also observed.
The Microscopic Study of Y-Ba-Cu-O Compound

Lin W. T.,Chu H. C.,Chen B. H.,Chang Y. H.,Chin T. S.,ITRI

DOI: https://doi.org/10.1557/proc-99-927

1987-01-01

Abstract:The microstructure of Y-Ba-Cu-O compound, sintered at 950°C for 16h, was examined by using transmission electron microscope(TEM). For the furnace cooling sample, two variants of–orthorhombic YBa2-Cu3O7−x (O-Y123) twins, grown on (110) and (110) planes, respectively, are crystallographically related to the matrix and produce a Widmanstatten morphology. The orientation relationship between the lath twin and the matrix is (001)T//(001) and [100]T//[010]M. The O-Y123 compound is unstable under tne electron irradition. Twin boundaries are identified as S-boundaries. The minor phases as Y2BaCuO5 (Y211) and BaCuO2 were also observed. For the air cooling sample, no superconductivity above 77K was found. The major phase is tetragonal Y123 (T-Y123), while small amount of 0-Y123 is also existent.
Properties Of Yba2cu3o7 Thin Films Deposited On Substrates And Bicrystals With Vicinal Offcut And Realization Of High Icrn Junctions

U. Poppe,Y. Y. Divin,M. I. Faley,J. S. Wu,C. L. Jia,p m shadrin,K. Urban

DOI: https://doi.org/10.1109/77.919884

IF: 1.9489

2001-01-01

IEEE Transactions on Applied Superconductivity

Abstract:The surface morphology, microstructure and transport properties of epitaxial YBa2Cu3O7 and PrBa2Cu3O7 thin films and heterostructures deposited on slightly vicinal substrates of SrTiO3 by high pressure oxygen sputtering were studied. The vicinal angles of the substrates and bicrystals were less then 13 degrees. Depending on the tilt angle of the substrate a transition from spiral or island to step-flow growth leading to an improvement of the surface roughness was observed. Atomic force and transmission electron microscopy were used for these investigations. Furthermore, electrical and structural properties of YBa2Cu3O7 thin films on vicinal offcut SrTiO3 bicrystals with different grain boundary types were studied. This included junctions with a 2x 12 degrees tilt or twist of the YBa2Cu3O7 c-axis across the grain boundary. In comparison to conventional [001]-tilt grain boundaries bicrystal Josephson junctions [100]-tilt grain boundaries showed high I-c R-n -products of up to 1.2 meV at 77 K and up to 8 meV at 4.2 K. IV-curve instabilities, probably of magnetic origin due to flux flow in the electrodes, often could he observed for junctions biased with high current densities.
Microstructure of Epitaxial YBa2Cu3O7−δ Thin Films Grown on Pb(Mg1/3Nb2/3)0.7Ti0.3O3 Substrates

Y. Yu,X. Zhang,J. W. Wang,Y. G. Zhao

DOI: https://doi.org/10.1016/j.jcrysgro.2012.05.042

IF: 1.8

2012-01-01

Journal of Crystal Growth

Abstract:The microstructure of epitaxial c-axis oriented YBa2Cu3O7−δ (YBCO) thin films grown on piezoelectric/ferroelectric (001) Pb(Mg1/3Nb2/3)0.7Ti0.3O3 (PMN-PT) substrates by pulsed laser deposition has been studied using transmission electron microscopy. It is shown that major defects in the films are interfacial misfit dislocations and planar defects. Moreover, a small amount of a-axis oriented domains with inclined domain walls are observed in the YBCO films and the formation mechanism of the inclined domain walls is discussed. In addition, tiny precipitates near the interface are observed in some cases. All these defects and the domain structure contribute to the strain relaxation of the epitaxial YBCO thin films. These findings may be helpful for future research on correlation of microstructure and physical properties in the high-Tc superconductor–ferroelectric heterostructures.
TEM Characterisation of YNi2B2C Thin Film Microstructure

G.H. Cao,P. Simon,W. Skrotzki,S.C. Wimbush,B. Holzapfel

DOI: https://doi.org/10.1007/s00339-004-2768-x

2004-01-01

Applied Physics A

Abstract:A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.
A transmission electron microscopy study of the microstructure and interface of zirconia-based thermal barrier coatings

y bai,qing zhen yang,j j tang,y h wang,kai liu,s w guo,z h han

DOI: https://doi.org/10.1016/j.jallcom.2014.09.058

IF: 6.2

2015-01-01

Journal of Alloys and Compounds

Abstract:Yttria-stabilized zirconia (YSZ)-based thermal barrier coatings (TBCs) were deposited by supersonic atmospheric plasma spraying (SAPS) and conventional atmospheric plasma spraying (APS). Transmission electron microscopy (TEM) showed that the average height and width of columnar crystals of SAPS-coating were (0.71 +/- 0.08) and (0.31 +/- 0.04) mu m, which was much smaller than that of APS-coating [(2.10 +/- 0.10) and (0.48 +/- 0.07) mu m]. The preferential growth direction of SAPS-columnar crystals was [1 0 1] under rapid solidification. A 3-nm-thick amorphous film was discovered at the splat/splat interface for both APS-/SAPS-coatings. (C) 2014 Elsevier B.V. All rights reserved.
Cross-sectional TEM studies of YBa2Cu3O7-x superlattices

Li Yijie,Lian Guijun,Gan Zizhao,Feng Jingwei

1995-01-01

Abstract:Microstructure of high-quality YBa2Cu3O7-x superlattices has been investigated using high-resolution transmission electron microscope (HRTEM). The observations revealed that the superlattices had atomic sharp interfaces between YBCO and PrBCO layers without interdiffusion. But undulations and steps of the layer thickness existed in the specimen. An intermediate layer about 1 nm in thickness with many defects, which was caused by the surface steps and dislocations at SrTiO3 substrate surface, was observed at the film-substrate interfaces. However, the films did not have large extended defects beyond several unit cells. The results suggested that when studying the two-dimensional transport properties and superconducting mechanism of YACO using YBCO/PrBCO superlattices or ultra-thin YBCO films, the influence of the microstructural elements must be taken into account.
Microstructure and Growth of the Epitaxial Superconducting YBa2Cu3O7 Films

GC Xiong,GJ Lian,YJ Li,ZZ Gan

DOI: https://doi.org/10.1016/s0921-4534(97)00348-1

1997-01-01

Abstract:Using high resolution transmission electron microscopy (HRTEM) and scanning tunneling microscopy (STM) three different growth processes of the epitaxial YBCO films are observed: (1) the epitaxial YBCO layers nucleate on perfect substrates and lead to flat surfaces. (2) one-unit cell steps on the substrate surfaces developed to dislocations of the grown YBCO film. (3) on tilted substrates stacks of terraces are the main surface morphologies. These results are clearly demonstrated that the substrates have significant influence on the microstructure of the epitaxial YBCO films.
Micro-Raman study of ultra-thin YBa2Cu3O7−δ/YSZ films

M.S Chen,Z.X Shen,W.Z Zhou,S.Y Xu,C.K Ong

DOI: https://doi.org/10.1016/S0921-4534(99)00214-2

1999-01-01

Abstract:Micro-Raman scattering measurements of ultra-thin YBa2Cu3O7-delta (YBCO) films of various thicknesses, deposited by pulsed laser ablation on the yttrium-stabilized-zirconia (YSZ) (001) substrates, were carried out. The frequency of the O(4)-A(g) mode shows a more marked increase with decrease in film thickness than the O(2,3)-B-1g mode does. The main contribution to the intensity of the O(2,3)-B-1g mode is shown to be from the c-axis oriented grains and that of the O(4)-A(g) mode comes from the a-axis oriented grains. Raman evidence for the formation of the BaZrO3 (BZO) transitional layer at the film interface was found, and the frequency changes of the O(4)-A(g) and O(2,3)-B-1g modes are explained in terms of lattice mismatch between YBCO and BZO at the interface. The large frequency increase of the O(4)-A(g) mode with decreasing film thickness is due to the large mismatch between the Cu(2)-Cu(2) separation and the length of one unit cell, of BZO, despite the good match between one unit cell of YBCO and three unit cells of BZO for the a-axis oriented grains. (C) 1999 Elsevier Science B.V. All rights reserved.
Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an Yni2b2c Thin Film

GH Cao,W Skrotzki,P Simon,SC Wimbush,B Holzapfel

DOI: https://doi.org/10.1021/cm050006t

IF: 10.508

2005-01-01

Chemistry of Materials

Abstract:An YNi 2 B 2 C thin film grown on a MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM) and high-resolution electron microscopy (HREM). Planview TEM analyses show that the film consists of isolated rectangular YNi 2 B 2 C grains distributed within a second phase. This phase was identified as monoclinic Y 2 Ni 1 5 B 6 with lattice parameters a = 1.42 nm, b = 1.07 nm, c = 0.96 nm, and β = 95°. Within the YNi 2 B 2 C grains, a hexagonal Y 0 . 9 1 5 Ni 4 . 1 2 B phase with lattice parameters a = 1.49 nm and c = 0.69 nm is intergrown with a cubic Y 2 O 3 phase with lattice parameter a = 1.06 nm. The orientation relationships between YNi 2 B 2 C, Y 2 O 3 , and Y 0 . 9 1 5 Ni 4 . 1 2 B are analyzed, and the mechanisms of phase formation are discussed.
Microstructure Study Of Bi4ti3o12-Srbi4ti4o15 And Bi3.25la0.75ti3o12-Srbi4ti4o15 Ceramics

D Su,Js Zhu,Dy Wang,Hlw Chan,Cl Choy,Yn Wang

DOI: https://doi.org/10.1109/ISAF.2002.1195873

2002-01-01

Abstract:TEM study is preformed on. mixed-layer type Bismuth compounds: B4Ti3O12-SrBi4Ti4O15 (BT-SBTi) and Bi3.25La0.75Ti3O12-SrBi4Ti4O15 (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90degrees domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.
Phase Field Crystal Study of Grain Boundary Structure and Annihilation Mechanism in Low-Angle Grain Boundary

Huijun Guo,Yuhong Zhao,Yuanyang Sun,Jinzhong Tian,Hua Hou,Kewu Qi,Xiaolin Tian

DOI: https://doi.org/10.1016/j.spmi.2019.03.020

IF: 3.22

2019-01-01

Superlattices and Microstructures

Abstract:Using the advantage of phase field crystal model in microstructure evolution, we simulated the details of two-dimensional triangular phase on atomic scale and diffusion time scale. The results show that the annihilation process of grain boundaries can be divided into three stages. The energy changes of the system at different stages are accurately calculated and the process is quantitatively analyzed. By comparing the atomic density distributions at different temperatures and orientation angles, it is shown that the grain boundary is sensitive to temperature. Within the range of low-angle, the increase of orientation angle inhibits the occurrence of annihilation and decreases the grain boundary migration rate. Under the applied stress, the orientation angle has a certain response relationship with the yield strength of the material. This work has some practical significance in the influence of microstructure on the mechanical properties of materials.
Microstructure and Interfaces Investigations of Yba2cu3o7/Prba2cu3o7 Superlattices by Hrtem

YJ LI,GC XIONG,GJ LIAN,J LI,ZZ GAN

DOI: https://doi.org/10.4028/www.scientific.net/msf.189-190.381

1995-01-01

Materials Science Forum

Abstract:Microstructure and interfaces of high-quality YBa2Cu3O7/PrBa2Cu3O7 (YBCO/PrBCO) superlattices have been investigated using high-resolution transmission electron microscope (HRTEM). The observations revealed that the superlattices had atomic sharp interfaces between YBCO and PrBCO layers without interdiffusion. But undulations and steps of the layer thickness existed in the specimen. A intermediate layer about 1nm thickness with many defects, which was caused by the surface steps and dislocations at SrTiO3 substrate surface, was observed at the film-substrate interface. However, the film did not have large extended defects beyond several unit cells. This has been achived by forming c/3 or 2c/3 step stacking faults at the substrate surface steps. The results suggested that when one probe the two-dimensional transport properties and superconducting mechanism of YBCO using YBCO/PrBCO superlattices or ultra-thin YBCO films, the influence of above microstructural elements must be taken into account.
Yba2cu3o7-Delta Thin-Films with Bao Precipitates

YJ TIAN,LP GUO,L LI,YQ ZHOU,Y YANG,ZX ZHAO,SF XU,HB LU,YL ZHOU,ZH CHEN,DF CUI,GZ YANG

DOI: https://doi.org/10.1063/1.112639

IF: 4

1994-01-01

Applied Physics Letters

Abstract:BaO precipitates with sizes between 10–100 nm in laser ablated YBa2Cu3O7−δ (YBCO) thin films on Y-stabilized Zirconia substrates have been identified by x-ray diffraction and transmission electron microscopy. The precipitates exhibit equiaxed shapes and grow epitaxially inside and on the surface of the YBCO films, with (001)BaO plane parallel to the a,b plane of YBCO. Some of these smaller precipitates and BaO/YBCO boundaries probably provide potential pinning sites for magnetic flux lines, which might contribute to the observed increase of critical current density with magnetic field B under B≤500 G in the case of B perpendicular to the c axis of the film.
Properties of YBa/sub 2/cu/sub 3/o/sub 7/ Thin Films Deposited on Substrates and Bicrystals with Vicinal Offcut and Realization of High I/sub C/r/sub N/ Junctions

U. Poppe,Y.Y. Divin,M.I. Faley,J.S. Wu,C.L. Jia,P. Shadrin,K. Urban

DOI: https://doi.org/10.1109/77.919884

2001-01-01

IEEE Transactions on Appiled Superconductivity

Abstract:The surface morphology, microstructure and transport properties of epitaxial YBa/sub 2/Cu/sub 3/O/sub 7/ and PrBa/sub 2/Cu/sub 3/O/sub 7/ thin films and heterostructures deposited on slightly vicinal substrates of SrTiO/sub 3/ by high pressure oxygen sputtering were studied. The vicinal angles of the substrates and bicrystals were less then 13/spl deg/. Depending on the tilt angle of the substrate a transition from spiral or island to step-flow growth leading to an improvement of the surface roughness was observed. Atomic force and transmission electron microscopy were used for these investigations. Furthermore, electrical and structural properties of YBa/sub 2/Cu/sub 3/O/sub 7/ thin films on vicinal offcut SrTiO/sub 3/ bicrystals with different grain boundary types were studied. This included junctions with a 2/spl times/12/spl deg/ tilt or twist of the YBa/sub 2/Cu/sub 3/O/sub 7/ c-axis across the grain boundary. In comparison to conventional [001]-tilt grain boundaries bicrystal Josephson junctions [100]-tilt grain boundaries showed high I/sub c/R/sub n/-products of up to 1.2 meV at 77 K and up to 8 meV at 4.2 K. IV-curve instabilities, probably of magnetic origin due to flux flow in the electrodes, often could be observed for junctions biased with high current densities.

Tem Study of Microstructure of Yba2cu3oy Bicrystal Grain Boundary Junctions Grown on Y2o3 Stabilized Zro2 Bicrystal

TEM STUDY OF THE MICROSTRUCTURE AND INTERFACES IN YBa2Cu3Oy THIN FILMS GROWN ON SILICON WITH A Eu2CuO4/Y-ZrO2 BI-LAYER BUFFER

TEM STUDY OF THE MICROSTRUCTURE AND INTERFACES IN <font>YBa</font><sub>2</sub><font>Cu</font><sub>3</sub><font>O</font><sub>y</sub> THIN FILMS GROWN ON SILICON WITH A <font>Eu</font><sub>2</sub><font>CuO</font><sub>4</sub>/<font>Y-ZrO</font><sub>2</sub> BI-LAYER BUFFER

Microscopic Structure of SrTiO3 Bicrystal Boundaries Studied with Scanning Tunneling and Atomic Force Microscopy

Microstructures of YBa1.85Eu0.15Cu3O7− Superconducting Films Grown on SrTiO3 and YSZ Substrates

Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2

Nondestructive Investigation of Microstructures and Defects at a SrTiO3 Bicrystal Boundary

The Microscopic Study of Y-Ba-Cu-O Compound

Properties Of Yba2cu3o7 Thin Films Deposited On Substrates And Bicrystals With Vicinal Offcut And Realization Of High Icrn Junctions

Microstructure of Epitaxial YBa2Cu3O7−δ Thin Films Grown on Pb(Mg1/3Nb2/3)0.7Ti0.3O3 Substrates

TEM Characterisation of YNi2B2C Thin Film Microstructure

A transmission electron microscopy study of the microstructure and interface of zirconia-based thermal barrier coatings

Cross-sectional TEM studies of YBa2Cu3O7-x superlattices

Microstructure and Growth of the Epitaxial Superconducting YBa2Cu3O7 Films

Micro-Raman study of ultra-thin YBa2Cu3O7−δ/YSZ films

Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an Yni2b2c Thin Film

Microstructure Study Of Bi4ti3o12-Srbi4ti4o15 And Bi3.25la0.75ti3o12-Srbi4ti4o15 Ceramics

Phase Field Crystal Study of Grain Boundary Structure and Annihilation Mechanism in Low-Angle Grain Boundary

Microstructure and Interfaces Investigations of Yba2cu3o7/Prba2cu3o7 Superlattices by Hrtem

Yba2cu3o7-Delta Thin-Films with Bao Precipitates

Properties of YBa/sub 2/cu/sub 3/o/sub 7/ Thin Films Deposited on Substrates and Bicrystals with Vicinal Offcut and Realization of High I/sub C/r/sub N/ Junctions