Micro-Raman study of ultra-thin YBa2Cu3O7−δ/YSZ films

M.S Chen,Z.X Shen,W.Z Zhou,S.Y Xu,C.K Ong
DOI: https://doi.org/10.1016/S0921-4534(99)00214-2
1999-01-01
Abstract:Micro-Raman scattering measurements of ultra-thin YBa2Cu3O7-delta (YBCO) films of various thicknesses, deposited by pulsed laser ablation on the yttrium-stabilized-zirconia (YSZ) (001) substrates, were carried out. The frequency of the O(4)-A(g) mode shows a more marked increase with decrease in film thickness than the O(2,3)-B-1g mode does. The main contribution to the intensity of the O(2,3)-B-1g mode is shown to be from the c-axis oriented grains and that of the O(4)-A(g) mode comes from the a-axis oriented grains. Raman evidence for the formation of the BaZrO3 (BZO) transitional layer at the film interface was found, and the frequency changes of the O(4)-A(g) and O(2,3)-B-1g modes are explained in terms of lattice mismatch between YBCO and BZO at the interface. The large frequency increase of the O(4)-A(g) mode with decreasing film thickness is due to the large mismatch between the Cu(2)-Cu(2) separation and the length of one unit cell, of BZO, despite the good match between one unit cell of YBCO and three unit cells of BZO for the a-axis oriented grains. (C) 1999 Elsevier Science B.V. All rights reserved.
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