Stable Few-Layer Mos2 Rectifying Diodes Formed By Plasma-Assisted Doping

mikai chen,hongsuk nam,sungjin wi,lian ji,xin ren,lifeng bian,shulong lu,xiaogan liang
DOI: https://doi.org/10.1063/1.4824205
IF: 4
2013-01-01
Applied Physics Letters
Abstract:We present a method for making stable MoS2 rectifying diodes using selected-area plasma treatment. The transport and X-ray photoelectron spectroscopic characterizations of MoS2 transistors treated with different plasmas confirm that the rectifying characteristics of MoS2 diodes are attributed to plasma-induced p-doping and p-n junctions in MoS2. Such plasma-doped diodes exhibit high forward/reverse current ratios (similar to 10(4) for SF6-treated diodes) and a superior long-term stability. They can play an important role in the development of nanoelectronic devices. In addition, the presented plasma-assisted doping process could be also used for making ambipolar MoS2 transistors and functionalizing other emerging two-dimensional materials. (C) 2013 AIP Publishing LLC.
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