Negative Magnetoresistance In Undoped Semiconducting Amorphous Carbon Films

rizwan ur rehman sagar,xiaozhong zhang,jimin wang,chengyue xiong
DOI: https://doi.org/10.1063/1.4869780
IF: 2.877
2014-01-01
Journal of Applied Physics
Abstract:Amorphous carbon (a-C) films were fabricated by chemical vapor deposition on SiO2 substrate. The a-C films have nano-crystalline sp(2) structure with the grain size of similar to 5 nm and an optical band gap of similar to 1.8 eV. The a-C films show negative magnetoresistance (MR) from 300 to 2K and an anomalous shape change of MR-magnetic field curves at 10 K. Grain boundary scattering theory and weak localization theory were used to explain the MR mechanism and shape change of MR-magnetic field curves. (C) 2014 AIP Publishing LLC.
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