Angular Magnetoresistance in Semiconducting Undoped Amorphous Carbon Thin Films

Rizwan Ur Rehman Sagar,Awais Siddique Saleemi,Xiaozhong Zhang
DOI: https://doi.org/10.1063/1.4919820
IF: 2.877
2015-01-01
Journal of Applied Physics
Abstract:Thin films of undoped amorphous carbon thin film were fabricated by using Chemical Vapor Deposition and their structure was investigated by using High Resolution Transmission Electron Microscopy and Raman Spectroscopy. Angular magnetoresistance (MR) has been observed for the first time in these undoped amorphous carbon thin films in temperature range of 2 ∼ 40 K. The maximum magnitude of angular MR was in the range of 9.5% ∼ 1.5% in 2 ∼ 40 K. The origin of this angular MR was also discussed.
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