Single Crystal Growth and Transport Properties of Cu-doped Topological Insulator Bi2Se3

Z. J. Li,Y. Liu,S. C. White,P. Wahl,X. M. Xie,M. H. Jiang,C. T. Lin
DOI: https://doi.org/10.1016/j.phpro.2012.06.182
2012-01-01
Physics Procedia
Abstract:We report on the growth of high quality single crystals of CuxBi2Se3 with x=0, 0.12 and 0.15, using Bridgman method. A study of crystal structure shows that the c-lattice parameter slightly decreases with an increasing level of Cu-doping. STM images indicate that both Cu-intercalation between Se-Se layers and Cu-substitution in Bi-layer sites are present. With dc magnetization measurements, superconducting transitions in Cu-intercalated Bi2Se3 have been found with a TC of 3.5K for x∼0.12 and approximately 3.6K for x∼0.15, respectively. The resistivity data show metallic behavior in the Bi2Se3 crystals and paramagnetic features are observed in the low temperature region of the Cu-doped samples.
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