Two Experimental Methods to Characterize Load Capacitance of A Cmos Gate

K Chen,CM Hu,P Fang,MR Lin,DL Wollesen
DOI: https://doi.org/10.1088/0268-1242/13/7/019
IF: 2.048
1998-01-01
Semiconductor Science and Technology
Abstract:The load capacitance of a CMOS gate has been experimentally characterized by two independent methods on the particular wafers fabricated for this study. Agreement between the two methods is obtained and confirmed using CMOS ring oscillators with gate oxide thicknesses from 2.5 to 5.8 nm and effective channel lengths down to 0.21 mu m at voltages from 1.5 to 3.3 V. This study provides the capacitance data for an analytical gate delay model.
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