Abstract:A two-step time-to-digital converter (TDC) is designed for the high-precision time measurement of the DIRC-like TOF (DTOF) detector at the Super Tau-Charm Facility (STCF). Extending the measurement range by Nutt's method, the TDC clock cycle is interpolated with two voltage-controlled tapped delay lines (TDL) connected by a dual-slope time amplifier (TA). By amplifying the residue from the first-step TDL-based interpolation with the TA and measuring it with the second TDL, the TDC resolution is significantly improved to sub-gate delay. Since the residue is extracted by a new method without the need of TA duplication or delay insertion, the TDC power consumption and conversion time are effectively reduced. By adopting the improved TA circuit into the TDC with a high gain, adjustable output offsets, and good linearity, the TDC measurement precision is guaranteed. In addition, a new DLL structure is proposed to stabilize the TDL against process, voltage, and temperature (PVT) variations with less power consumption. Benefiting from the proposed residue extraction method and DLL structure, the TDC exhibits low power consumption. To verify the TDC design, a prototype chip with two TDC channels is fabricated in GlobalFoundries (GF) 180 nm CMOS technology for performance evaluation. With a system clock of 150 MHz, it has a resolution (LSB) of 16.5 ps and a maximum sample rate of 6 MS/s. The differential nonlinearity (DNL) error ranges from - 0.98 LSB to 0.87 LSB and the integral nonlinearity error (INL) ranges from- 4.21 LSB to 2.83 LSB. With a bin-by-bin calibration method, the measured TDC precision is 12.1 ps on average within the 0-20 ns time interval measurement range. In addition, the TDC has low temperature sensitivity and does not require recalibration within a 20 C-degrees temperature range. Each TDC channel consumes 434 mu W power at 1 MS/s sample rate. The test results confirm that the proposed TDC can achieve high precision with a moderate sample rate and low power consumption without highly scaled technologies, which can meet the requirements of the DTOF detector at STCF.

Recent Developments and Design Challenges of High-Performance Ring Oscillator CMOS Time-to-Digital Converters

A Two-Step Time-to-Digital Converter with 5.6ps Resolution and 1 - 4255μs Measurement Range

A 50-Ps Gated VCRO-Based TDC with Compact Phase Interpolators for Flash LiDAR

A low-power coarse-fine time-to-digital converter in 65nm CMOS

A Resolution-Tunable Low Power Time-to-Digital Converter With an Improved ADDLL Based on a Cyclic Pulse Ring Oscillator

A Multi-Path Gated Ring Oscillator Based Time-To-Digital Converter In 65 Nm Cmos Technology

A 8bits, 6.2ps Resolution Two-Step Time-to-digital Converter with Set-Reset-based Arbiters and Signal Tracking Mechanism

A High-Resolution Pipeline Time-to-digital Converter in 0.18μm CMOS Technology

A Low-power Synthesizable Time-to-Digital Converter Using Amplification to Overcome Mismatch

A 12 Ps Precision Two-Step Time-to-Digital Converter Consuming 434 $\mu$ W at 1 MS/s in 180 Nm CMOS with a Dual-Slope Time Amplifier

A 12bit 39ps Two-Step Time-to-Digital Converter in 40nm CMOS

Time-Encoding Analog-to-Digital Converters: Bridging the Analog Gap to Advanced Digital CMOS-Part 1: Basic Principles

A 0.013mm2 3.2ns Input Range 10-bit Cyclic Time-to-Digital Converter Using Gated Ring Oscillator With Phase Domain Reset in 65nm CMOS

Design of Time-to-Digital Converters for Time-Over-Threshold Measurement in Picosecond Timing Detectors

A Low-Power Time-to-Digital Converter for the CMS Endcap Timing Layer (ETL) Upgrade

A High-Resolution TDC Design Based on Multistep Fine Time Measurement by Utilizing Delay-Adjustable Looped Carry Chains on FPGAs

An Fpga-Integrated Time-To-Digital Converter Based on A Ring Oscillator for Programmable Delay Line Resolution Measurement

A ring-oscillator based multi-mode time-to-digital converter on Xilinx Kintex-7 FPGA

A 1ps Resolution Two-Step Time-to-digital Converter Using Parallel Digital-to-time Converters

A Low Power Tdc With 0.5ps Resolution For Adpll In 40nm Cmos

Cross-Detection and Dual-Side Monitoring Schemes for FPGA-Based High-Accuracy and High-Precision Time-to-Digital Converters