Abstract:There is a need to understand materials exposed to overlapping extreme environments such as high temperature, radiation, or mechanical stress. When these stressors are combined there may be synergistic effects that enable unique microstructural evolution mechanisms to activate. Understanding of these mechanisms is necessary for the input and refinement of predictive models and critical for engineering of next generation materials. The basic physics and underlying mechanisms require advanced tools to be investigated. The in situ ion irradiation transmission electron microscope (I³TEM) is designed to explore these principles. To quantitatively probe the complex dynamic interactions in materials, careful preparation of samples and consideration of experimental design is required. Particular handling or preparation of samples can easily introduce damage or features that obfuscate the measurements. There is no one correct way to prepare a sample; however, many mistakes can be made. The most common errors and things to consider are highlighted within. The I³TEM has many adjustable variables and a large potential experimental space, therefore it is best to design experiments with a specific scientific question or questions in mind. Experiments have been performed on large number of sample geometries, material classes, and with many irradiation conditions. The following are a subset of examples that demonstrate unique in situ capabilities utilizing the I3TEM. Au nanoparticles prepared by drop casting have been used to investigate the effects of single ion strikes. Au thin films have been used in studies on the effects of multibeam irradiation on microstructure evolution. Zr films have been exposed to irradiation and mechanical tension to examine creep. Ag nanopillars were subjected to simultaneous high temperature, mechanical compression, and ion irradiation to study irradiation induced creep as well. These results impact fields including: structural materials, nuclear energy, energy storage, catalysis, and microelectronics in space environments.

Novel techniques of preparing TEM samples for characterization of irradiation damage.

Preparation of TEM Samples of Ferritic Alloys.

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Flash electropolishing of BCC Fe and Fe-based alloys

Self-marked preparation of site-specific transmission electron microscope lamellae of nanodevices using focusing ion beam technique.

Box 8: Sample Preparation For Transmission Electron Microscopy Using A Focused Ion Beam

Exploring the influence of focused ion beam processing and scanning electron microscopy imaging on solid-state electrolytes

Optimized Pre-Thinning Procedures of Ion-Beam Thinning for TEM Sample Preparation by Magnetorheological Polishing

An Efficient and Cost-Effective Method for Preparing Transmission Electron Microscopy Samples from Powders

FIB-shield: a Structure to Safely Transfer and Precisely Mount Beam-Sensitive TEM Specimens under Focused Ion Beam

Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments

Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling

Systematic study of FIB-induced damage for the high-quality TEM sample preparation

Transmission electron microscopy sample preparation method for micrometer-sized powder particles using focused ion beam

In-Plane Liftout and Push-to-Pull for In Situ Mechanical Testing of Irradiated Inconel X-750

The Trends of in Situ Focused Ion Beam Technology: Toward Preparing Transmission Electron Microscopy Lamella and Devices at the Atomic Scale

Effect of Ion Irradiation Introduced by Focused Ion-Beam Milling on the Mechanical Behaviour of Sub-Micron-Sized Samples

Ion Beam Processing in the Sample Preparation for the Analysis of Ductile Damage in Deep Drawing Steels

New Attempts on Preparing Tungsten FIB Sample

A handy method for high quality specimen preparation for chip-based in-situ transmission electron microscopy