[How does one become cited?].

M. Zaviačič

Bratislava Medical Journal

Abstract:

What problem does this paper attempt to address?

Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments

Alexey Minenkov,Natalija Šantić,Tia Truglas,Johannes Aberl,Lada Vukušić,Moritz Brehm,Heiko Groiss

DOI: https://doi.org/10.1557/s43577-021-00255-5

Abstract:In situ transmission electron microscopy (TEM) is a powerful tool for advanced material characterization. It allows real-time observation of structural evolution at the atomic level while applying different stimuli such as heat. However, the validity of analysis strongly depends on the quality of the specimen, which has to be prepared by thinning the bulk material to electron transparency while maintaining the pristine properties. To address this challenge, a novel method of TEM samples preparation in plan-view geometry was elaborated based on the combination of the wedge polishing technique and an enhanced focused ion beam (FIB) workflow. It involves primary mechanical thinning of a broad sample area from the backside followed by FIB-assisted installation on the MEMS-based sample carrier. The complete step-by-step guide is provided, and the method's concept is discussed in detail making it easy to follow and adapt for diverse equipment. The presented approach opens the world of in situ TEM heating experiments for a vast variety of fragile materials. The principle and significant advantage of the proposed method are demonstrated by new insights into the stability and thermal-induced strain relaxation of Ge Stranski-Krastanov islands on Si during in situ TEM heating. Supplementary information: The online version contains supplementary material available at 10.1557/s43577-021-00255-5.
Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

Xiang Li Zhong,Sibylle Schilling,Nestor J Zaluzec,M Grace Burke

DOI: https://doi.org/10.1017/S1431927616011855

Abstract:In recent years, an increasing number of studies utilizing in situ liquid and/or gaseous cell scanning/transmission electron microscopy (S/TEM) have been reported. Because of the difficulty in the preparation of suitable specimens, these environmental S/TEM studies have been generally limited to studies of nanoscale structured materials such as nanoparticles, nanowires, or sputtered thin films. In this paper, we present two methodologies which have been developed to facilitate the preparation of electron-transparent samples from conventional bulk metals and alloys for in situ liquid/gaseous cell S/TEM experiments. These methods take advantage of combining sequential electrochemical jet polishing followed by focused ion beam extraction techniques to create large electron-transparent areas for site-specific observation. As an example, we illustrate the application of this methodology for the preparation of in situ specimens from a cold-rolled Type 304 austenitic stainless steel sample, which was subsequently examined in both 1 atm of air as well as fully immersed in a H2O environment in the S/TEM followed by hyperspectral imaging. These preparation techniques can be successfully applied as a general procedure for a wide range of metals and alloys, and are suitable for a variety of in situ analytical S/TEM studies in both aqueous and gaseous environments.
Possibility of an integrated transmission electron microscope: enabling complex in-situ experiments

Khalid Hattar,Katherine L. Jungjohann

DOI: https://doi.org/10.1007/s10853-020-05598-z

IF: 4.5

2021-01-03

Journal of Materials Science

Abstract:Abstract Multimodal in-situ experiments are the wave of the future, as this approach will permit multispectral data collection and analysis during real-time nanoscale observation. In contrast, the evolution of technique development in the electron microscopy field has generally trended toward specialization and subsequent bifurcation into more and more niche instruments, creating a challenge for reintegration and backward compatibility for in-situ experiments on state-of-the-art microscopes. We do not believe this to be a requirement in the field; therefore, we propose an adaptive instrument that is designed to allow nearly simultaneous collection of data from aberration-corrected transmission electron microscopy (TEM), probe-corrected scanning transmission electron microscopy, ultrafast TEM, and dynamic TEM with a flexible in-situ testing chamber, where the entire instrument can be modified as future technologies are developed. The value would be to obtain a holistic understanding of the underlying physics and chemistry of the process-structure–property relationships in materials exposed to controlled extreme environments. Such a tool would permit the ability to explore, in-situ, the active reaction mechanisms in a controlled manner emulating those of real-world applications with nanometer and nanosecond resolution. If such a powerful tool is developed, it has the potential to revolutionize our materials understanding of nanoscale mechanisms and transients. Graphical Abstract

materials science, multidisciplinary
Electron-Induced Radiation Chemistry in Environmental Transmission Electron Microscopy

Kunmo Koo,Nikhil S. Chellam,Sangyoon Shim,Chad A. Mirkin,George C. Schatz,Xiaobing Hu,Vinayak P. Dravid

2024-07-27

Abstract:In-situ environmental transmission electron microscopy (E-TEM) provides sub-Angstrom spatiotemporal information on nanoscale chemical transformations. However, the high-energy electron probe can significantly affect the surrounding medium's chemistry and induce side reactions within the area of interest. Radiolysis, or the dissociation of molecules under electron beam irradiation, has become an increasingly important consideration in in-situ nanomaterials characterization. While numerous studies have explored this phenomenon in liquid-cell TEM, there are no reported extensions to gas phase TEM thus far. Herein, we present a generalized computational model to elucidate radiation chemistry in both gas and liquid E-TEM. Our model reveals that gas phase E-TEM produces radiolytic species with lower reactivity than in the liquid phase. However, these radiolysis species can accumulate to levels that interfere with desired reactions, especially at higher pressures. We verify our model by studying the radiation-promoted oxidation of aluminum nanocubes and the disproportionation of carbon monoxide, where we find increasing the electron beam dose rate increases the rate of AlOx production and deposited carbon, respectively. Additionally, we propose guidelines to control the production of radiolysis species within these closed-cell in-situ nanoreactors. Taken together, these findings should pave the way for nanoscale control of chemical reactions in E-TEM.

Materials Science
Ion-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples

Shuo Zhang,Vivek Garg,Gediminas Gervinskas,Ross K.W. Marceau,Emily Chen,Rakesh G. Mote,Jing Fu

DOI: https://doi.org/10.1021/acsanm.1c03396

IF: 6.14

2021-11-02

ACS Applied Nano Materials

Abstract:In this work, a “stand-out” approach is proposed for the preparation of nanoscale specimens for high-resolution imaging such as transmission electron microscopy (TEM) and atom probe tomography (APT). By controlling the FIB (focused ion beam) irradiation parameters, including the ion dose, beam direction, and beam energy, the proposed approach is capable of lifting nano- or microscale specimens in situ to a desired height, driven by internal stresses. The “stand-out” specimens can be further shaped by FIB milling into needle-shaped or micropad geometries for various nanocharacterization techniques. A detailed investigation of the underlying ion-induced bending (IIB) mechanisms has been performed through both experiments and theoretical analysis of the control of molybdenum cantilevers at both ambient and cryogenic temperatures. Additional materials including copper, silicon, and steel have also been trialed, and all the results suggest IIB to be a universal phenomenon. Application of IIB has been demonstrated for site-specific TEM imaging of gold nanoparticles. Furthermore, the proposed approach also provides unique site-specific sample preparation for APT. It is expected that this approach will streamline nanoscale specimen preparation for high-resolution imaging and facilitate the development of fully automated solutions.

materials science, multidisciplinary,nanoscience & nanotechnology
In-Plane Liftout and Push-to-Pull for In Situ Mechanical Testing of Irradiated Inconel X-750

Lucia R. Gomez-Hurtado,Tiankai Yao,Fei Teng,Mario D. Matos,Laura Hawkins,Ge Yang,Yachun Wang

DOI: https://doi.org/10.3390/en17174199

IF: 3.2

2024-08-25

Energies

Abstract:A streamlined sample preparation method for nanomechanical testing is needed to improve the quality of specimens, reduce the cost, and increase the versatility of specimen fabrication. This work outlines an in-plane liftout focused ion beam (FIB) fabrication procedure to prepare electron-transparent specimens for in situ transmission electron microscopy (TEM) nanomechanical testing. Ion etching and electron backscatter diffraction (EBSD) techniques were used to lift out a [110] oriented grain from a neutron-irradiated bulk X-750 alloy. Careful control of voltages and currents ensured precision. Top surface thinning sweeps prevented resurfacing and redeposition while dog-bone geometries were shaped with a 1:4 gauge width-to-milling pattern diameter ratio. Nanotensile testing in the TEM with a picoindenter allowed for the estimation of an ultimate tensile strength of 2.41 GPa, and inspection revealed a high density of bubbles in the X-750 matrix. The proposed fabrication procedure is significant for preparing samples from radioactive materials, studying complex structures that are orientation-dependent, and analyzing desired planar areas.

energy & fuels
Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings

Abner Velazco,Daen Jannis,Armand Béché,Johan Verbeeck

DOI: https://doi.org/10.48550/arXiv.2105.01617

2021-04-30

Abstract:The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites, organic and biological materials. As this effect depends on both the electron beam and the sample and can involve multiple damage pathways, its study remained difficult and is plagued with irreproducibity issues, circumstantial evidence, rumours, and a general lack of solid data. Here we take on the experimental challenge to investigate the role of the STEM scan pattern on the damage behaviour of a commercially available zeolite sample with the clear aim to make our observations as reproducible as possible. We make use of a freely programmable scan engine that gives full control over the tempospatial distribution of the electron probe on the sample and we use its flexibility to obtain mutliple repeated experiments under identical conditions comparing the difference in beam damage between a conventional raster scan pattern and a newly proposed interleaved scan pattern that provides exactly the same dose and dose rate and visits exactly the same scan points. We observe a significant difference in beam damage for both patterns with up to 11 % reduction in damage (measured from mass loss). These observations demonstrate without doubt that electron dose, dose rate and acceleration voltage are not the only parameters affecting beam damage in (S)TEM experiments and invite the community to rethink beam damage as an unavoidable consequence of applied electron dose.

Materials Science
The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy

Nigel D. Browning,Jony Castagna,Angus I. Kirkland,Amirafshar Moshtaghpour,Daniel Nicholls,Alex W. Robinson,Jack Wells,Yalin Zheng

DOI: https://doi.org/10.1063/5.0135245

IF: 4

2023-02-03

Applied Physics Letters

Abstract:Images and spectra obtained from aberration corrected scanning transmission electron microscopes (STEM) are now used routinely to quantify the morphology, structure, composition, chemistry, bonding, and optical/electronic properties of nanostructures, interfaces, and defects in many materials/biological systems. However, obtaining quantitative and reproducible atomic resolution observations from some experiments is actually harder with these ground-breaking instrumental capabilities, as the increase in beam current from using the correctors brings with it the potential for electron beam modification of the specimen during image acquisition. This beam effect is even more acute for in situ STEM observations, where the desired outcome being investigated is a result of a series of complicated transients, all of which can be modified in unknown ways by the electron beam. The aim in developing and applying new methods in STEM is, therefore, to focus on more efficient use of the dose that is supplied to the sample and to extract the most information from each image (or set of images). For STEM (and for that matter, all electron/ion/photon scanning systems), one way to achieve this is by sub-sampling the image and using Inpainting algorithms to reconstruct it. By separating final image quality from overall dose in this way and manipulating the dose distribution to be best for the stability of the sample, images can be acquired both faster and with less beam effects. In this paper, the methodology behind sub-sampling and Inpainting is described, and the potential for Inpainting to be applied to novel real time dynamic experiments will be discussed.

physics, applied
High-energy synchrotron x-ray techniques for studying irradiated materials

Xuan Zhang,P. Kenesei,H. Sharma,Jun-Sang Park,J. Almer,D. Hoelzer,Meimei Li

DOI: https://doi.org/10.1557/JMR.2015.50

2015-05-01

Abstract:High performance materials that can withstand radiation, heat, multiaxial stresses, and corrosive environment are necessary for the deployment of advanced nuclear energy systems. Nondestructive in situ experimental techniques utilizing high energy x-rays from synchrotron sources can be an attractive set of tools for engineers and scientists to investigate the structure–processing–property relationship systematically at smaller length scales and help build better material models. In this study, two unique and interconnected experimental techniques, namely, simultaneous small-angle/wide-angle x-ray scattering (SAXS/WAXS) and far-field high-energy diffraction microscopy (FF-HEDM) are presented. The changes in material state as Fe-based alloys are heated to high temperatures or subject to irradiation are examined using these techniques.

Engineering,Physics,Materials Science
Electron irradiation: from test to material tailoring

A. Alessi,O. Cavani,R. Grasset,H.-J. Drouhin,V. I. Safarov,M. Konczykowski

2023-09-01

Abstract:In this article, we report some examples of how high-energy electron irradiation can be used as a tool for shaping material properties turning the generation of point-defects into an advantage beyond the presumed degradation of the properties. Such an approach is radically different from what often occurs when irradiation is used as a test for radiation hard materials or devices degradation in harsh environments. We illustrate the potential of this emerging technique by results obtained on two families of materials, namely semiconductors and superconductors.

Materials Science
Non-destructive study of collision cascade damage in self-ion irradiated tungsten using HR-EBSD and ECCI

Hongbing Yu,Phani Karamched,Suchandrima Das,Junliang Liu,Kenichiro Mizohata,Felix Hofmann

DOI: https://doi.org/10.1016/j.jnucmat.2021.153074

2020-08-08

Abstract:Understanding defect production and evolution under irradiation is a long-standing multi-scale problem. Conventionally, experimental examination of irradiation-induced defects (IIDs) has mainly relied on transmission electron microscopy (TEM), which offers high spatial resolution but requires destructive sample preparation. Furthermore, limited field of view and low strain sensitivity make multi-scale characterisation and quantitative strain measurements difficult. Here we explore the potential of using advanced techniques in the scanning electron microscope (SEM) to non-destructively probe irradiation damage at the surface of bulk materials. Electron channelling contrast imaging (ECCI) is used to image nano-scale irradiation-induced defects in 20 MeV self-ion irradiated tungsten, the main candidate material for fusion reactor armour. The results show an evolution of the damage microstructure from uniformly and randomly distributed nano-scale defects at 0.01 dpa (displacement per atom) to string structures extending over hundreds of nanometres at 1 dpa. Cross-correlation based high-resolution EBSD (HR-EBSD) is used to probe the lattice strain fields associated with IIDs. While there is little strain fluctuation at 0.01 dpa, significant heterogeneity in the lattice strains is observed at 0.1 dpa, increasing with dose until saturation at 0.32 dpa. The characteristic length scale of strain fluctuations is ~500 nm. Together, ECCI and HR-EBSD reveal a transition from a structure where defects are disordered to a structure with long-range order driven by elastic interactions between pre-existing defects and new cascade damage. This study demonstrates that SEM provides an attractive tool for rapid throughput, non-destructive, multi-scale and multi-aspect characterisation of irradiation damage.

Materials Science
Optimizing Experimental Parameters for Orbital Mapping

Manuel Ederer,Stefan Löffler

2023-05-25

Abstract:A new material characterization technique is emerging for the transmission electron microscope (TEM). Using electron energy-loss spectroscopy, real space mappings of the underlying electronic transitions in the sample, so called orbital maps, can be produced. Thus, unprecedented insight into the electronic orbitals responsible for most of the electrical, magnetic and optical properties of bulk materials can be gained. However, the incredibly demanding requirements on spatial as well as spectral resolution paired with the low signal-to-noise ratio severely limits the day-to-day use of this new technique. With the use of simulations, we strive to alleviate these challenges as much as possible by identifying optimal experimental parameters. In this manner, we investigate representative examples of a transition metal oxide, a material consisting entirely of light elements, and an interface between two different materials to find and compare acceptable ranges for sample thickness, acceleration voltage and electron dose for a scanning probe as well as for parallel illumination.

Materials Science
Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

D. C. Bufford,F. F. Abdeljawad,S. M. Foiles,K. Hattar

DOI: https://doi.org/10.1063/1.4935238

IF: 4

2015-11-09

Applied Physics Letters

Abstract:Nanostructuring has been proposed as a method to enhance radiation tolerance, but many metallic systems are rejected due to significant concerns regarding long term grain boundary and interface stability. This work utilized recent advancements in transmission electron microscopy (TEM) to quantitatively characterize the grain size, texture, and individual grain boundary character in a nanocrystalline gold model system before and after in situ TEM ion irradiation with 10 MeV Si. The initial experimental measurements were fed into a mesoscale phase field model, which incorporates the role of irradiation-induced thermal events on boundary properties, to directly compare the observed and simulated grain growth with varied parameters. The observed microstructure evolution deviated subtly from previously reported normal grain growth in which some boundaries remained essentially static. In broader terms, the combined experimental and modeling techniques presented herein provide future avenues to enhance quantification and prediction of the thermal, mechanical, or radiation stability of grain boundaries in nanostructured crystalline systems.

physics, applied
Imaging Beam‐Sensitive Materials by Electron Microscopy

Qiaoli Chen,Christian Dwyer,Guan Sheng,Chongzhi Zhu,Xiaonian Li,Changlin Zheng,Yihan Zhu

DOI: https://doi.org/10.1002/adma.201907619

IF: 29.4

2020-02-28

Advanced Materials

Abstract:Electron microscopy allows the extraction of multidimensional spatiotemporally correlated structural information of diverse materials down to atomic resolution, which is essential for figuring out their structure–property relationships. Unfortunately, the high‐energy electrons that carry this important information can cause damage by modulating the structures of the materials. This has become a significant problem concerning the recent boost in materials science applications of a wide range of beam‐sensitive materials, including metal–organic frameworks, covalent–organic frameworks, organic–inorganic hybrid materials, 2D materials, and zeolites. To this end, developing electron microscopy techniques that minimize the electron beam damage for the extraction of intrinsic structural information turns out to be a compelling but challenging need. This article provides a comprehensive review on the revolutionary strategies toward the electron microscopic imaging of beam‐sensitive materials and associated materials science discoveries, based on the principles of electron–matter interaction and mechanisms of electron beam damage. Finally, perspectives and future trends in this field are put forward.

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Transmission electron microscopy (TEM) of Earth and planetary materials: A review

M. R. Lee

DOI: https://doi.org/10.1180/minmag.2010.074.1.1

2010-02-01

Mineralogical Magazine

Abstract:Abstract Using high intensity beams of fast electrons, the transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) enable comprehensive characterization of rocks and minerals at micrometre to sub-nanometre scales. This review outlines the ways in which samples of Earth and planetary materials can be rendered sufficiently thin for TEM and STEM work, and highlights the significant advances in site-specific preparation enabled by the focused ion beam (FIB) technique. Descriptions of the various modes of TEM and STEM imaging, electron diffraction and X-ray and electron spectroscopy are outlined, with an emphasis on new technologies that are of particular relevance to geoscientists. These include atomic-resolution Z-contrast imaging by high-angle annular dark-field STEM, electron crystallography by precession electron diffraction, spectrum mapping using X-rays and electrons, chemical imaging by energy-filtered TEM and true atomic-resolution imaging with the new generation of aberration-corrected microscopes. Despite the sophistication of modern instruments, the spatial resolution of imaging, diffraction and X-ray and electron spectroscopy work on many natural materials is likely to remain limited by structural and chemical damage to the thin samples during TEM and STEM.

mineralogy
Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials

Chao Zhang,Konstantin L. Firestein,Joseph F. S. Fernando,Dumindu Siriwardena,Joel E. Treifeldt,Dmitri Golberg

DOI: https://doi.org/10.1002/adma.201904094

IF: 29.4

2019-09-30

Advanced Materials

Abstract:In situ transmission electron microscopy (TEM) is one of the most powerful approaches for revealing physical and chemical process dynamics at atomic resolutions. The most recent developments for in situ TEM techniques are summarized; in particular, how they enable visualization of various events, measure properties, and solve problems in the field of energy by revealing detailed mechanisms at the nanoscale. Related applications include rechargeable batteries such as Li‐ion, Na‐ion, Li–O2, Na–O2, Li–S, etc., fuel cells, thermoelectrics, photovoltaics, and photocatalysis. To promote various applications, the methods of introducing the in situ stimuli of heating, cooling, electrical biasing, light illumination, and liquid and gas environments are discussed. The progress of recent in situ TEM in energy applications should inspire future research on new energy materials in diverse energy‐related areas.

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Support-based transfer and contacting of individual nanomaterials for in-situ nanoscale investigations

Simon Hettler,Mohammad Furqan,Raul Arenal

DOI: https://doi.org/10.1002/smtd.202400034

2024-03-13

Abstract:Although in-situ transmission electron microscopy (TEM) of nanomaterials has been gaining importance in recent years, difficulties in sample preparation have limited the number of studies on electrical properties. Here, a support-based preparation method of individual 1D and 2D materials is presented, which yields a reproducible sample transfer for electrical investigation by in-situ TEM. Using a mechanically rigid support grid allows the reproducible transfer and contacting to in-situ chips by focused ion beam with minimum damage and contamination. The transfer quality is assessed by exemplary studies of different nanomaterials, including a monolayer of WS2. Preliminary results from in-situ test experiments give an overview of possible studies, which concern the interplay between structural properties and electrical characteristics on the individual nanomaterial level as well as failure analysis under electrical current or studies of electromigration, Joule heating and related effects. The TEM measurements can be enriched by additional correlative microscopy techniques, which allow the study with a spatial resolution in the range of a few microns. Although developed for in-situ TEM, the present transfer method is also applicable to transferring nanomaterials to similar chips for performing further studies or even for using them in potential electrical/optoelectronic/sensing devices.

Mesoscale and Nanoscale Physics
Comparative study of ion milling techniques for the preparation of ceramic fibers in transmission electron microscopy

Clémentine Fellah,Bérangère Lesaint

DOI: https://doi.org/10.1016/j.micron.2024.103612

IF: 2.381

Micron

Abstract:Sample preparation, essential to any analysis, remains an under-documented step. Preparation methods for transmission electron microscopy (TEM) are complex and lead to artifacts that need to be identified to avoid wrong conclusions about the sample's microstructure. Ion milling techniques are increasingly becoming the reference techniques to prepare thin foils. The possibilities of different ion beam processes for milling samples will be shown and compared, using ceramic carbon/carbide fibers, a material applied in many industrial applications, as a test specimen. This overview of ion milling preparation techniques will enable us to identify the advantages, disadvantages and parameters in order to best prepare these thin samples. It will be carried out for the community, and will also highlight a new preparation method for ceramic fibers to minimize the artefacts inherent in these techniques.
An In Situ Transmission Electron Microscopy Study on the Synergistic Effects of Au-ion Irradiation and High Temperature on Nuclear Graphite Microstructure

Melonie Thomas,Ryan Schoell,Md Abu Jafar Rasel,Md Rahman,Winson Kuo,John Watt,Stephen House,Khalid Hattar,William Windes,Aman Haque

DOI: https://doi.org/10.1088/2053-1591/ad37a6

IF: 2.025

2024-03-27

Materials Research Express

Abstract:The combined effect of high-temperature and heavy-ion irradiation on Mrozowski cracks (MC) and nuclear graphite crystallographic dimensions have been studied using in situ heating and in situ ion-irradiation in the transmission electron microscope (TEM). Electron transparent lamella of nuclear graphite, IG-110, was irradiated, using a 2.8 MeV Au beam at an ion flux of 3.991 x 1010 ion cm -2 s -1 for 70 minutes at 800 o C. Upon high-temperature irradiation, Mrozowski crack closure was studied quantitatively. The analysis showed linear, positive expansion of nuclear graphite which is significantly different from the dimensional changes previously reported for low-dose neutron irradiation of nuclear graphite in which the material undergoes negative to positive expansion via a turnaround radiation dose. The trend of the thermal expansion coefficient (CTE) of pristine IG-110 in this study is consistent with previous reports in the 100-800 o C temperature region in which the dimensional change ranges from negative to positive values.

materials science, multidisciplinary
Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Josh Kacher,Yao Xie,Sven P. Voigt,Shixiang Zhu,Henry Yuchi,Jordan Key,Surya R. Kalidindi

DOI: https://doi.org/10.48550/arXiv.2104.08688

2021-08-21

Abstract:Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.

Computer Vision and Pattern Recognition

[How does one become cited?].

Advanced preparation of plan-view specimens on a MEMS chip for in situ TEM heating experiments

Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

Possibility of an integrated transmission electron microscope: enabling complex in-situ experiments

Electron-Induced Radiation Chemistry in Environmental Transmission Electron Microscopy

Ion-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples

In-Plane Liftout and Push-to-Pull for In Situ Mechanical Testing of Irradiated Inconel X-750

Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy

High-energy synchrotron x-ray techniques for studying irradiated materials

Electron irradiation: from test to material tailoring

Non-destructive study of collision cascade damage in self-ion irradiated tungsten using HR-EBSD and ECCI

Optimizing Experimental Parameters for Orbital Mapping

Unraveling irradiation induced grain growth with in situ transmission electron microscopy and coordinated modeling

Imaging Beam‐Sensitive Materials by Electron Microscopy

Transmission electron microscopy (TEM) of Earth and planetary materials: A review

Recent Progress of In Situ Transmission Electron Microscopy for Energy Materials

Support-based transfer and contacting of individual nanomaterials for in-situ nanoscale investigations

Comparative study of ion milling techniques for the preparation of ceramic fibers in transmission electron microscopy

An In Situ Transmission Electron Microscopy Study on the Synergistic Effects of Au-ion Irradiation and High Temperature on Nuclear Graphite Microstructure

Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy