Blocking ion diffusion and minimizing electron charging in solid electrolytes under electron-beam irradiation for transmission electron microscopy analysis

Kazuo Yamamoto,Ryotaro Aso,Taisuke Nakamura,Yasuyuki Fujiwara,Yasutoshi Iriyama,Takeshi Kobayashi,Yuki Nomura,Takeharu Kato
DOI: https://doi.org/10.1007/s10008-024-05869-8
IF: 2.747
2024-04-03
Journal of Solid State Electrochemistry
Abstract:Evaluating ion-conductive solid electrolytes (SEs) accurately is crucial for advancing solid-state battery technology. Scanning/transmission electron microscopy (S/TEM) is a valuable technique for examining the local characteristics of battery materials. However, the tolerance of SEs to high-energy electron beams is notably lower than that of electrode active materials, because SEs generally have low electron conductivity. Here, we propose a specialized coating technique for TEM samples, termed "nano-shield," which enables stable and accurate observation of their micro-/nano-structures. Nano-shield consists of a dual-layer coating combining an amorphous insulating layer of aluminum oxide (AlO x ) with a conductive carbon (C) film. The AlO x layer blocks ion diffusion in the TEM samples, and the C layer minimizes electron charging during electron-beam irradiation. By applying a nano-shield, we successfully visualized the atomic structures of a lithium-ion-conductive SE, Li 1.3 Al 0.3 T 1.7 (PO 4 ) 3 (LATP), by using STEM at room temperature. Additionally, we performed a precise elemental analysis of a sodium-ion-conductive SE, Na 3 Zr 2 Si 2 PO 12 (NZSP), via STEM equipped with energy-dispersive X-ray spectroscopy (STEM-EDS). Our findings demonstrate that nano-shield enhances the reliability of S/TEM observations of SEs and sheds light on its underlying protective mechanisms.
electrochemistry
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