Abstract:Charge transport behaviors of dielectric under electron radiation have an important influence on surface flashover performance. In this paper, charging process and model of dielectric during electron radiation are investigated based on the synergistic effect of electron movement on dielectric surface and charge transport properties in dielectric surface layer. For one thing, electrons accumulated in dielectric surface layer will form a reverse electric field acting against kinetic electrons flowing to dielectric surface, which affects the energy and density of electrons reaching the surface. For another, the changes of electron energy and density will further affect the dynamic processes of electron deposition, transport and accumulation in the surface layer. A dielectric charging model is proposed, and charge transport characteristics in dielectric surface and surface layer are obtained, including the temporal behavior of the incident kinetic electrons flowing to dielectric surface, the temporal behavior of secondary electrons and surface conduction charge, as well as the spatial and temporal behavior of the interior potential and electric field. Based on surface potential decay curves of polyimide under different electron energy levels (3-11 keV), the surface potential decay process and model are investigated. The surface trap distribution of polyimide shows different properties under different energy levels. The shallow trap level increases slightly with the increase of electron energy, ranging from 0.81 eV-0.85 eV, while the deep trap level remains unchanged about 0.94 eV. Besides, the amount of trap charge density gradually increases with the increase of electron energy.

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