Abstract:The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its unprecedented ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are susceptible to numerous forms of crosstalk and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. In this work, we develop a method for easily demonstrating the presence of hysteretic (ie, false ferroelectric) long-range interactions between the sample and cantilever body. This method should be easy to implement in any VM-AFM measurement. We then go on to demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including mems actuators and sensors, memristor, energy storage and memory.

A Resolution Study for Electrostatic Force Microscopy on Bimetallic Samples Using the Boundary Element Method

Numerical Studies on Sub-10 Nanometer Resolution Imaging in Electrostatic Force Microscopy

Modeling Electrostatic Force Microscopy for Conductive and Dielectric Samples Using the Boundary Element Method

Improving Lateral Resolution of Ambient Electrostatic Force Microscopy by Intermittent Contact Method

Improving Lateral Resolution of Electrostatic Force Microscopy by Multifrequency Method under Ambient Conditions

Imaging of Electronical and Magnetic Properties on Sub-10 Nanometer Scale with Scanning Force Microscopy in Ambient

A novel electrochemical atomic force microscope and its applications

Quantitative Noncontact Electrostatic Force Imaging of Nanocrystal Polarizability

Scanning-Electrostatic-Force Microscopy: Self-Consistent Method for Mesoscopic Surface Structures

Electrokinetics In Micro-Channeled Cantilevers: Extending The Toolbox For Reversible Colloidal Probes And Afm-Based Nanofluidics

Electric Force Microscopy, Surface Potential Imaging, and Surface Electric Modification with the Atomic Force Microscope (AFM)

Insight into the Experimental Error in the Mapping of Electrical Properties with Electrostatic Force Microscopy

Detection of Embedded Nanostructures by Electrostatic Force Microscopy

Numerical Simulation of the Interaction Between Nanodielectrics and the Probe of Electrostatic Force Microscopy

Lateral Resolution And Signal To Noise Ratio In Electrostatic Force Detection Based On Scanning Probe Microscopy

Quantitative Electrostatic Force Measurement and Characterization Based on Oscillation Amplitude Using Atomic Force Microscopy

Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

The EDMR Microscope - Combining Conductive Atomic Force Microscopy with Electrically Detected Magnetic Resonance

Quantitative Electromechanical Atomic Force Microscopy

Discrimination and analysis of interactions in non-contact Scanning Force Microscopy

Probing Intermolecular Forces And Potentials With Magnetic Feedback Chemical Force Microscopy