Abstract:Electrochemical strain microscopy (ESM) is a powerful tool to resolve ionic transport and electrochemical processes with a nanoscale resolution. To ascertain the underlying mechanism that governs the signal generation of ESM imaging, a fully coupled nonlinear electrochemomechanical model based on the finite element method is developed and applied to LiMn2O4 particles. The frequency dependence of the ESM response, in particular the response at high frequencies used in the detection regime, is investigated in detail. The performed analysis demonstrates that the error induced by the decoupling approximation increases with decreasing bias frequency due to the relatively large variation in ion concentration. In the high frequency regime, the results reveal that the stress effect is negligible and local electroneutrality holds, providing the simplification of numerical simulation for ESM imaging. By applying an alternative current voltage, we suggest that the detectable signal observed in ESM imaging can be attributed to the Vegard effect, which was controversial in previous linear models. The local distribution of ion concentration shows that the ionic reorganization only takes place near the tip-surface junction, the spatial extent of which can be described by two relevant lengths, the contact radius and ion drift length, which determine the spatial lateral resolution and depth resolution, respectively, in ESM imaging. Through a parametric study, the electromigration is proved to be dominant at high frequencies and the relationship between ESM amplitude and some parameters may offer a strategy to measure local electrochemical reactivity. The impact of contact force is evaluated and the results indicate that the local compression reduces ion concentration and the resultant ESM signal in the detection regime. Thus attention must be paid to the contact force when a comparison between different measurements is conducted. The combination of the numerical model and experiment holds the promise of quantitative probing of local electrochemical parameters in solids.

Quantitative Noncontact Electrostatic Force Imaging of Nanocrystal Polarizability

A Resolution Study for Electrostatic Force Microscopy on Bimetallic Samples Using the Boundary Element Method

Analytical Approach to the Local Contact Potential Difference on (001) Ionic Surfaces: Implications for Kelvin Probe Force Microscopy

Lateral Resolution And Signal To Noise Ratio In Electrostatic Force Detection Based On Scanning Probe Microscopy

Modeling Electrostatic Force Microscopy for Conductive and Dielectric Samples Using the Boundary Element Method

Numerical Studies on Sub-10 Nanometer Resolution Imaging in Electrostatic Force Microscopy

Numerical Simulation of the Interaction Between Nanodielectrics and the Probe of Electrostatic Force Microscopy

Discrimination and analysis of interactions in non-contact Scanning Force Microscopy

Scanning-Electrostatic-Force Microscopy: Self-Consistent Method for Mesoscopic Surface Structures

Surface Potential Modeling and Reconstruction in Kelvin Probe Force Microscopy

Nanoscale mapping of electric polarizability in a heterogeneous dielectric material with surface irregularities

Direct Measurement of Electrostatic Fields Within the Zernike Electrostatic Phase Plate Using Single 155 Nm Teflon Nanoparticle Attached to the Pillar-Shaped Atomic Force Microscope Tip

A research on the surface charge with different coating tip by Electrostatic Force Microscope

Transverse Surface Mechanical Behavior and Modified Elastic Modulus for Charged Nanostructures

Detection of Embedded Nanostructures by Electrostatic Force Microscopy

Dynamic electric force microscopy observation of polarization of CdS nanocrystals and carbon nanotubes on silicon substrates

The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy

Single charge regime electrodynamic force measuring in solution by upconversion photonic force microscope

Nonlinear Electrochemomechanical Modelling of Electrochemical Strain Microscopy Imaging

Electrochemical Impedance Spectroscopy of Single Au Nanorods.

Quantitative Electrostatic Force Measurement and Characterization Based on Oscillation Amplitude Using Atomic Force Microscopy