The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopy

Marc Fuhrmann,Alexander Krivcov,Anna Musyanovych,Ronald Thoelen,Hildegard Möbius
DOI: https://doi.org/10.1002/pssa.201900828
2020-01-14
physica status solidi (a)
Abstract:<p>Topographic crosstalk is still an issue in Magnetic Force Microscopy (MFM) as well as in Electric Force Microscopy (EFM). Using interleave mode measurements combining a first topographic scan with a second scan in a certain distance from the surface following the topography from the first scan, capacitive coupling effects occur while measuring nanoparticles. This paper focuses on the influence of the dielectric constant of polystyrene nanoparticles in interleave mode MFM measurements. In order to investigate the contribution of the capacitive coupling effect to the signal, non‐magnetic polystyrene nanoparticles are investigated. The tip‐substrate distance change above the nanoparticle leads to a positive phase shift in MFM signals. Simulations and fits to the experimental data allow the investigation of the influence of the dielectric constant of the nanoparticles on topographic effects in interleave mode measurements in general.</p><p>This article is protected by copyright. All rights reserved.</p>
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