Magnetic Force Microscopy: High Quality Factor Two-Pass Mode

Christopher Habenschaden,Sibylle Sievers,Alexander Klasen,Andrea Cerreta,Hans Werner Schumacher

2024-06-25

Abstract:Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy (SPM) that allows the imaging of magnetic samples with spatial resolution of tens of nm and stray fields down to the mT range. Spatial resolution and field sensitivity can be improved significantly by measuring in vacuum conditions. This effect originates from the higher quality factor (Q-factor) of the cantilevers oscillation in vacuum compared to ambient conditions. However, while high Q-factors are desirable as they directly improve the magnetic measurement signal, they pose a challenge when pursuing a standard MFM two-pass (lift) mode measurement. At high Q-factors amplitude-based topography measurements become impossible and MFM phase response behaves non-linear. Here we present an implementation of a modified two-pass mode into a vacuum atomic force microscope (AFM) that overcomes these issues. By controlling Q in the first pass and using a phase-locked loop (PLL) technique in the second pass, high Q-factor measurements in vacuum are enabled. By measuring the cantilevers frequency shift instead of phase shift, otherwise emerging non-linearities are eliminated. The achievable improvements in resolution and sensitivity are demonstrated on patterned magnetic nanostructured samples. Elimination of non-linear response is showcased by a measurement of a very well-known calculable multilayer reference sample that is used for tip calibration in quantitative MFM (qMFM).

Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

This paper focuses on the issues encountered when using Magnetic Force Microscopy (MFM) for high-precision measurements in vacuum and how to improve the resolution and magnetic field sensitivity. Under vacuum conditions, the two-pass mode measurement of MFM becomes challenging due to the increased quality factor (Q factor) of the probe. The high Q factor leads to nonlinear phase response and possible probe damage. To address this issue, the researchers propose an improved two-pass mode that combines Q control and Phase-Locked Loop (PLL) technology. In the first scan, the Q factor is reduced through Q control to enable stable measurement of surface topography. In the second scan (lift mode), an external lock-in amplifier is used to track frequency changes instead of phase changes, thereby eliminating nonlinearity and achieving high Q factor measurements.

In the new method, the researchers demonstrate the improvement in resolution and sensitivity brought about by this improved two-pass mode using the Park Systems NX-Hivac Atomic Force Microscope. By conducting measurements on nanostructured magnetic samples, they show that this approach eliminates nonlinear response and calibrates quantitative MFM (qMFM) using a known multilayer reference sample.

Overall, this paper aims to address the technical challenges encountered when performing high-precision magnetic measurements using MFM in a vacuum environment, and improves the performance of MFM through innovative measurement strategies.