Micromagnetic Studies of Ultrahigh Resolution Magnetic Force Microscope Tip Coated by Soft Magnetic Materials

Jiangnan Li,Na Chen,Dan Wei,Masaaki Futamoto

DOI: https://doi.org/10.1109/tmag.2014.2337835

IF: 1.848

2015-01-01

IEEE Transactions on Magnetics

Abstract:Magnetic force microscope (MFM) tips coated by soft magnetic materials can achieve a spatial resolution above 10 nm. It is interesting to analyze why tips coated with soft magnetic materials can achieve such a high resolution. In experiment, an MFM tip coated by amorphous FeB can achieve a resolution of 8 nm; therefore, we chose an FeB tip as an example and establish a micromagnetic model to understand the measurement mechanism of the soft magnetic MFM tip. In the FeB film simulation, the random crystalline anisotropy results in a soft magnetic loop with an in-plane coercivity of 0.2 Oe, and the film surface roughness will raise the coercivity to the order of 1 Oe. In the tip simulation, it is found that the FeB-coated tip can be switched in a uniform field of the order of 100 Oe, but can remain near a remanent state in a stray field resulting from media. A simple model is set up to analyze the MFM images of bits in hard disk drivers using the simulated magnetic properties of the tip and resolution similar to 10 nm is confirmed.