Quantifying Dielectric Material Charge Trapping and De‐Trapping Ability via Ultra‐Fast Charge Self‐Injection Technique
Shuyan Xu,Jian Wang,Huiyuan Wu,Qionghua Zhao,Gui Li,Shaoke Fu,Chuncai Shan,Kaixian Li,Zhiyi Zhang,Chenguo Hu
DOI: https://doi.org/10.1002/adma.202312148
IF: 29.4
2024-02-07
Advanced Materials
Abstract:Recently, utilizing the air breakdown effect in the charge excitation strategy has been proved as an efficient charge injection technique to increase the surface charge density of dielectric polymers for triboelectric nanogenerators (TENGs). However, quantitative characterization of the ability of dielectric polymers to trap reverse charges and the effect on the startup time of secondary self‐charge excitation (SSCE) are essential for extensive applications. Here, we propose an ultra‐fast charge self‐injection technique based on a self‐charge excitation strategy and introduce a standard method to quantify the charge trapping and de‐trapping abilities of 23 traditional tribo‐materials. Furthermore, the relationship between the distribution of dielectric intrinsic deep, shallow trap states and transportation of trapped charges is systematically analyzed in this article. It shows that the de‐trapping rate of charges directly determines the reactivation and failure of SSCE. Finally, independent of TENG contact efficiency, an ultra‐high charge density of 2.67 mC m−2 and an ultra‐fast startup time of SSCE is obtained using a 15 εm poly(vinylidene fluoride‐trifluoroethylene) film, breaking the historical record for material modification. As a standard for material selection, this work quantifies the charge trapping and de‐trapping ability of the triboelectric dielectric series and provides insights for understanding the charge transport in dielectrics . This article is protected by copyright. All rights reserved
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology