Threshold Voltage and 1/f Noise Degradation in Carbon Nanotube Field Effect Transistors under Hot-Carrier Stress

Lim, P.,Xinran Wang,Dai, Hongjie,Nishi, Yoshio
DOI: https://doi.org/10.1109/drc.2008.4800758
2008-01-01
Abstract:We have shown that CNT-FETs suffer under hot carrier stress on a similar level to those of conventional silicon FETs, despite its advantage in transport properties. More studies on CNT- FET operating reliability must therefore be conducted before it can be used for practical applications.
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