Surface Recombination in InP/InAlAs/GaAsSb/InP Double Heterojunction Bipolar Transistors

Chai Wah Ng,Hong Wang,K. Radhakrishnan
DOI: https://doi.org/10.1109/iciprm.2007.381146
2007-01-01
Abstract:In this work, a detailed study on the surface recombination in InP/GaAsSb double heterojunction bipolar transistors (DHBTs) with an InP–InAlAs composite emitter was carried out. The experimental data clearly revealed that the surface recombination was effectively suppressed by using InP–InAlAs composite emitter in the devices. At a low collector current density JC, a reduction in the normalized emitter periphery surface recombination current KB_surf of by a factor of 50 was observed. The physical mechanisms responsible for the surface recombination in the InP/GaAsSb DHBTs with an InP–InAlAs composite emitter were examined by characterization of the temperature-dependent KB_surf. The results demonstrate the great potential for aggressive scaling of GaAsSb DHBTs by using an InP–InAlAs composite emitter configuration.
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