Scaling analysis of interconnectivity and crosstalk in VLSI circuits

Zheng, L.-R.,Tenhunnen, H.
DOI: https://doi.org/10.1109/EPEP.1998.733905
1998-01-01
Abstract:This paper analyses the interconnectivity and crosstalk of submicron wires used for VLSI interconnects. The maximum interconnectivity is optimized under some fundamental constraints such as wire geometries and crosstalk etc.
What problem does this paper attempt to address?