Towards high-speed, write-disturb tolerant 3D vertical RRAM arrays

hongyu chen,bin gao,haitong li,rui liu,peng huang,zhe chen,bing chen,feifei zhang,liang zhao,zizhen jiang,lifeng liu,xiaoyan liu,jinfeng kang,shimeng yu,yoshio nishi,h s philip wong
DOI: https://doi.org/10.1109/VLSIT.2014.6894434
2014-01-01
Abstract:3D RRAM array suffers more serious reliability issues than 2D array due to the additional dimension involved. This paper systematically assesses the cell-location-dependent write-access (selected cells) and disturbance issues (unselected cells) for a 3D vertical RRAM array. Using a combination of experiments and simulations, a methodology is developed to enable array-level evaluation by conducting single-device measurements and without the need to fabricate a full 3D array. Based on this evaluation method, it is found that a double-sided bias (DSB) scheme improves write-disturb tolerance by a factor of 1800 and reduces write latency by 19 % under worst-case analyses.
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