Atomic layer deposition of high-quality HFO2 film on graphene using low energy electron beam pretreatment

Ye Qing,Shen Chen,Yuehui Jia,Jian Guo,liming ren,yunyi fu,ru huang,xing zhang
DOI: https://doi.org/10.1109/ICSICT.2014.7021332
2014-01-01
Abstract:We present a new pretreatment technique for deposition of uniform, pinhole-free and ultra-thin (≤5nm) high-k dielectric in any desired location on graphene. The key point of our technique is to pre-deposit a 1-nm seed layer for ALD of HfO2 by using low energy electron beam scan on graphene, which may not deteriorate the electrical properties of graphene. This work open a new route to fabricate the high-quality high-k dielectric for building graphene-based devices.
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