GaAs-based near-infrared up-conversion device fabricated by wafer fusion

Yao Yang,Huichun Liu,WenZhong Shen,James A. Gupta,Hui Luo,Margaret Buchanan,Zbigniew R. Wäsilewski
DOI: https://doi.org/10.1049/el.2010.3543
2011-01-01
Electronics Letters
Abstract:Reported for the first time is a full GaAs-based room-temperature near infrared (NIR) up-conversion device fabricated by wafer-fusing a GaNAsSb/GaAs pin photodetector (PD) with a GaAs/AlGaAs light emitting diode (LED). NIR photons with wavelengths in the range 1.3-1.6 μm were up-converted to 0.87 μm.
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