Formulization of Long-Time Domain Switching Around the Coercive Field from Imprint Measurements on Ferroelectric Thin Films

A. Q. Jiang,J. W. Fei,Y. Y. Lin,T. A. Tang
DOI: https://doi.org/10.1063/1.2948931
IF: 2.877
2008-01-01
Journal of Applied Physics
Abstract:The time interval for the completion of slow polarization reversal in ferroelectric thin films measured in the order of magnitude of 10−9–100s is broadened by more than two decades as the applied field approaches the coercive field of domain switching. The domain-switching kinetics is conjectured to change from the classical Kolmogorov–Avrami–Ishibashi (KAI) model at high fields to nucleation-limited-switching (NLS) model at low fields. However, the true voltage drop across the film from the real-time measurement of the oscilloscope remains constant at a coercive voltage Vc during polarization reversal irrespective of the applied voltage. Therefore, the above high-field assumption for KAI does not exist. From our measurements, a long-time effect of imprint can occur for any slow processes of physical phenomena, even if the imprint field is very weak. The imprinted Vc can be estimated either from the voltage shift in the curve of switched polarization versus the applied voltage or directly from the height variation in domain-switching current plateau after an imprint voltage Vimp for time timp (1μs0 to exhibit a linear time dependence in a logarithmic scale above an initial time on the order of 1.0μs, even if under Vimp
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