Evidence of Nanosecond-Scale Charge Injection During Domain Switching from Fast Imprint Measurements in Pb(Zr,Ti)O3 Thin Films at Low Temperatures

A. Q. Jiang,H. H. Yu,T. A. Tang
DOI: https://doi.org/10.1063/1.3139771
IF: 4
2009-01-01
Applied Physics Letters
Abstract:Fast imprint measurements of coercive voltages from domain switching current after various dc biasing voltages at low temperatures evidence multilevel interfacial charge injections in Pt/IrO2/Pb(Zr0.4Ti0.6)O-3/IrO2/Pt thin-film capacitors with suppressed thermal noises. Initially, a quick charge injection occurs during domain switching with injection current equal to domain switching current. After completion of polarization reversal, a slow charge injection continues with ultimate injected charge density nearly independent of biasing voltages at 77.6 K. This is very different from normal observations of a semilogarithmic time dependence of the coercive voltage at room temperature above 1 mu s.
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