Abstract:Aging effects (such as Negative Bias Temperature Instability (NBTI)) can cause the temporal degradation of threshold voltage of transistors, and have become major reliability concerns for deep-sub-micron (DSM) designs. Meanwhile, leakage power dissipation becomes dominant in total power as technology scales. While multi-threshold voltage assignment has been shown as an effective way to reduce leakage, the NBTI-degradation rates vary with different initial threshold voltage assignment, and therefore motivates the co-optimizations of leakage reduction and NBTI mitigation. This paper minimizes leakage power during high-level synthesis of circuits with bounded delay degradation (thus guaranteed lifetime), using multi-V-th resource libraries. We first propose a fast evaluation approach for NBTI-induced degradation of architectural function units, and multi-V-th resource libraries are built with degradation characterized for each function unit. We then propose an aging-bounded high-level synthesis framework, within which the degraded delays are used to guide the synthesis, and leakage power is optimized through the proposed aging-aware resource rebinding algorithm. Experimental results show that, the proposed techniques can effectively reduce the leakage power with an extra 26% leakage reduction, compared to traditional aging-unaware multi-V-th assignment approach.

Leakage Power Reduction Through Dual Vth Assignment Considering Threshold Voltage Variation

Signal-Path-Level Dual-VT Assignment for Leakage Power Reduction

An Algorithm for Reducing Leakage Power Based on Dual-Threshold Voltage Technique

Leakage Power Optimization for Clock Network Using Dual-Vth Technology

Dual-Vth Leakage Reduction with Fast Clock Skew Scheduling Enhancement

Leakage-Power-Aware Scheduling with Dual-Threshold Voltage Design

Improving Dual V T Technology by Simultaneous Gate Sizing and Mechanical Stress Optimization

Behavioral Level Dual-Vth Design for Reduced Leakage Power with Thermal Awareness

Signal-Path Level Assignment For Dual-V-T Technique

Leakage Power Aware Scheduling In High-Level Synthesis

Variation-aware Supply Voltage Assignment for Minimizing Circuit Degradation and Leakage.

Minimizing Leakage Power In Aging-Bounded High-Level Synthesis With Design Time Multi-V-Th Assignment

Run-time Demand Estimation and Modulation of On-Chip Decaps at System Level for Leakage Power Reduction in Multicore Chips

Nbti-Aware Dual V-Th Assignment for Leakage Reduction and Lifetime Assurance

Variation-aware gate sizing and clustering for post-silicon optimized circuits.

Min-cut Based Leakage Power Aware Scheduling in High-Level Synthesis

Study on leakage power estimation and reduction methodology of CMOS circuit

Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage

Statistical analysis of full-chip leakage power for 65nm CMOS node and beyond

Analysis and Mitigation of Variability in Subthreshold Design

Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques