Abstract:The ever-increasing chip power dissipation in SoCs has imposed great challenges on today’s circuit design. It has been shown that multiple threshold and supply voltages assignment (multi-Vth/Vdd) is an effective way to reduce power dissipation. However, most of the prior multi-Vth/Vddoptimizations are performed under deterministic conditions. With the increasing process variability that has significant impact on both the power dissipation and performance of circuit designs, it is necessary to employ statistical approaches in analysis and optimizations for low power. This paper studies the impact of process variations on the multi-Vth/Vddtechnique at the behavioral synthesis level. A multi-Vth/Vddresource library is characterized for delay and power variations at different voltage combinations. Meanwhile, device sizing is performed on the resources in the library to mitigate the impact of variation, and to enlarge the design space for better quality of the design choice. A parametric yield-driven resource binding algorithm is then proposed, which uses the characterized power and delay distributions and efficiently maximizes power yield under a timing yield constraint. During the resource binding process, voltage level converters are inserted between resources when required. Experimental results show that significant power reduction can be achieved with the proposed variation-aware framework, compared with traditional worstcase based deterministic approaches.

Behavioral Level Dual-Vth Design for Reduced Leakage Power with Thermal Awareness

Leakage Power Reduction Through Dual Vth Assignment Considering Threshold Voltage Variation

Minimizing Leakage Power In Aging-Bounded High-Level Synthesis With Design Time Multi-V-Th Assignment

Signal-Path-Level Dual-VT Assignment for Leakage Power Reduction

An Algorithm for Reducing Leakage Power Based on Dual-Threshold Voltage Technique

Dual-Vth Leakage Reduction with Fast Clock Skew Scheduling Enhancement

Leakage Power Optimization for Clock Network Using Dual-Vth Technology

Signal-Path Level Assignment For Dual-V-T Technique

Nbti-Aware Dual V-Th Assignment for Leakage Reduction and Lifetime Assurance

Improving Dual V T Technology by Simultaneous Gate Sizing and Mechanical Stress Optimization

Variation-aware gate sizing and clustering for post-silicon optimized circuits.

Design Time Body Bias Selection for Parametric Yield Improvement.

Thermal Effects with Leakage Power Considered in 2D/3D Floorplanning

Peak Temperature Reduction by Physical Information Driven Behavioral Synthesis with Resource Usage Allocation

Variation-aware Supply Voltage Assignment for Minimizing Circuit Degradation and Leakage.

Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques

Parametric Yield Driven Resource Binding In Behavioral Synthesis With Multi-V-Th/V-Dd Library

Gate Replacement Techniques For Simultaneous Leakage And Aging Optimization

A Thermal-Aware Ilp-Based Algorithm In Behavioral Synthesis

Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-Vth/VddLibrary and Device Sizing

A Thermal-Conscious Integrated Circuit Power Model and Its Impact on Dynamic Voltage Scaling Techniques