An empirical model of leakage current in poly-silicon TFTs

WeiJing Wu,Ruohe Yao,Yi Hu,Shan Li
2007-01-01
Abstract:Based on an approximate expression for generation rate, an empirical model for poly-Si TFT leakage current is developed in this paper. In this model, the leakage current is composed of two sections: the leakage current induced by vertical electric field in the overlap region and that induced by lateral electric field in the lateral depleted region. The proposed model is analytical without numerical integration, hence attractive for circuit simulation. In addition, it is suitable for poly-Si TFIs either before or after passivation. The model has been verified by a good agreement between simulated results and experimental data.
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