A Fully Analytical Current Model for Tunnel Field-Effect Transistors Considering the Effects of Source Depletion and Channel Charges

Zhijun Lyu,Hongliang Lu,Yuming Zhang,Yimen Zhang,Bin Lu,Xiaoran Cui,Yingxiang Zhao
DOI: https://doi.org/10.1109/TED.2018.2870249
IF: 3.1
2018-01-01
IEEE Transactions on Electron Devices
Abstract:In this paper, a universal analytical current model for a double-gate Si-based tunnel field-effect transistor (TFET) is presented considering the effects of charges in source depletion region and channel. An accurate surface potential model is developed first by solving the pseudo-2-D Poisson equations in the depletion regions, and then is used to calculate the drain tunneling current. The modelin...
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