A compact model for double-gate tunneling field-effect-transistors and its implications on circuit behaviors

Lining Zhang,Jin He,Mansun Chan
DOI: https://doi.org/10.1109/IEDM.2012.6478994
2012-01-01
Abstract:A compact model for tunneling field-effect-transistors (TFETs) is presented. The model includes a band-to-band tunneling (BTBT) current module and a terminal charge module. TCAD simulations show that the model describes TFETs currents and capacitances accurately. The model is implemented into a circuit simulator and used to simulate TFETs logic circuits and SRAMs. Unique features in TEFTs including large overshoot during switching, long delay and uni-directional conduction are demonstrated.
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