[Study on Extracting Raman Spectra of Single Component and Structure from Impure Amorphous Spectra].

Gao Min,Liu Wei,Yang Jun-tao,Zhang Shu-lin,Guo Hui,Zhang Guo-yi
DOI: https://doi.org/10.3321/j.issn:1000-0593.2007.05.024
2007-01-01
Spectroscopy and spectral analysis
Abstract:X-ray diffraction and Raman spectra show that the used amorphous SiC and GaN samples are impure. Adopting the new subtracting method with weighted impurity spectra, we obtained amorphous SiC and GaN Raman spectra involving only single component and structure. The good fitting between the calculated phonon density of states (PDOS) and the reduced Raman spectra confirms that the purified Raman spectra is really the amorphous Raman spectra, and the adopted spectral subtracting method with weighted impurity spectra is successful.
What problem does this paper attempt to address?