The characterization of ZrO2 films with different substrate bias voltages

Sha Zhao,Kewei Xu
2005-01-01
Journal of the Korean Physical Society
Abstract:ZrO2 thin films were deposited by r.f. reactive magnetron sputtering. The effect of substrate negative bias voltages on phase structure and optical properties of ZrO2 thin films was investigated by X-ray diffraction, trans mission-electron microscopy, electron spectroscopy for chemical analysis (ESCA), atomic-force microscopy and spectrophotometry. The results show that higher crystallinity of tetragonal-(101) ZrO2 films deposited on glass is produced at high substrate bias voltages and smaller grains can be obtained. SiO2 will be introduced near the interface when high bias voltages are applied on silicon. Under biased sputter deposition, the morphology of ZrO2 films is ameliorated and the surface roughness decreases with an increase of bias voltage. The transmittance increases with the increase of bias voltages, while the transmittance of ZrO2 films under biased sputtering is slightly lower than for those deposited with no bias voltages. The maximum refractive index (at A 500 nm) can reach 2.1607, that matches the corresponding value of bulk ZrO2.
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