Measurement Of The Magnetoelectric Coefficient Using A Scanning Evanescent Microwave Microscope

Chen Gao,Bo Hu,XueFei Li,Chihui Liu,Makoto Murakami,KaoShuo Chang,Christian J. Long,Manfred Wüttig,Ichiro Takeuchi
DOI: https://doi.org/10.1063/1.2093925
IF: 4
2005-01-01
Applied Physics Letters
Abstract:A quantitative magnetoelectric coefficient measurement method was developed based on scanning evanescent microwave microscopy. This unique technique does not require electrodes and has advantages that it has a high spatial resolution and can simultaneously measure other related properties such as the nonlinear dielectric constant. We have demonstrated that this technique can detect the magnetoelectric coefficient of thin film samples as low as 10 mV/cm Oe. (C) 2005 American Institute of Physics.
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