Study of annealed sol-gel PZT films prepared by reversed-dip-coating

Zhu Chen,Shuren Zhang,Chengtao Yang,Jinlong Li,Sheng Wang,Shuiqin Zhang
2004-01-01
Abstract:Sol-Gel PZT films were prepared by reversed-dip-coating of precursor-monomers of lead acetate trihydrate[Pb(OCOCH3)2 3H2O], zirconium nitrite (Zr(NO3)4·5H2O), and titanium butoxide Ti(OC4H9)4 on Pt/Ti/SiO2/Si substrates, respectively. The films were characterized with X-ray diffraction (XRD) and atomic force microscopy (AFM) to understand influence of film growth conditions on its properties, including annealing temperature, cooling rate, and oxygen pressure, etc.
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