Fabrication of Nanoparticle Pattern Through Atomic Force Microscopy Tip-Induced Deposition on Modified Silicon Surfaces

JH Liao,L Huang,N Gu
DOI: https://doi.org/10.1088/0256-307x/19/1/342
2002-01-01
Chinese Physics Letters
Abstract:With an atomic force microscopy (AFM) tip used as a "nib" and gold colloidal particles as "ink", patterns of gold colloidal particles have been deposited successfully from the AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane, i.e. (3-mercaptopropyl)-triethoxysilane. This was used as an adhesion agent and can immobilize nanoparticles delivered from the AFM tip onto the substrate surface.
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