Abstract:Over the past decade, experimental microscopy and spectroscopy have made significant progress in the study of the morphological, optical, electronic and transport properties of materials. These developments include higher spatial resolution, shorter acquisition times, more efficient monochromators and electron analysers, improved contrast imaging and advancements in sample preparation techniques. These advances have driven the need for more accurate theoretical descriptions and predictions of material properties. Computer simulations based on first principles and Monte Carlo methods have emerged as a rapidly growing field for modeling the interaction of charged particles, such as electron, proton and ion beams, with various systems, such as slabs, nanostructures and crystals. This report delves into the theoretical and computational approaches to modeling the physico-chemical mechanisms that occur when charged beams interact with a medium. These mechanisms encompass single and collective electronic excitation, ionization of the target atoms and the generation of a secondary electron cascade that deposits energy into the irradiated material. We show that the combined application of ab initio methods, which are able to model the dynamics of interacting many-fermion systems, and Monte Carlo methods, which capture statistical fluctuations in energy loss mechanisms by random sampling, proves to be an optimal strategy for the accurate description of charge transport in solids. This joint quantitative approach enables the theoretical interpretation of excitation, loss and secondary electron spectra, the analysis of the chemical composition and dielectric properties of solids and contributes to our understanding of irradiation-induced damage in materials, including those of biological significance.

Monte Carlo Calculation Of The Energy Distribution Of Backscattered Electrons

A Simulation Study on the Flash X-Ray Spectra Spatial Distribution

Quantifying the Coherent Backscatter Enhancement of Non-Spherical Particles with Discrete Dipole Approximation.

Monte Carlo simulation study of electron yields from compound semiconductor materials

A Monte Carlo investigation of secondary electron emission from solid targets: spherical symmetry versus momentum conservation within the classical binary collision model

Influence of Surface Roughness on Elastically Backscattered Electrons

The Monte Carlo simulation of Compton back-scattering imaging system with detector array

Inverse Bremsstrahlung Absorption and the Evolution of Electron Distributions Accounting for Electron-Electron Collisions

A simplified positron elastic scattering model for Monte Carlo calculations

Studies of energy dissipation distribution in low-energy electron beam lithography by Monte Carlo method

Simulating the secondary electron avalanche of MCP by Geant4

Analysis of finite-size coated electromagnetic bandgap structure by an efficient scattering matrix method

Secondary electron emission from gold microparticles in the transmission electron microscope: comparison of Monte Carlo simulations with experimental results

An advanced two-scale model of EM backscattering from rough surfaces

Monte Carlo simulations of dual energy X-ray inspection systems

A calculation approach for current density distribution evolution of secondary electrons using differential algebra method

Monte Carlo Method for Calculating Particle Radiation Detector Correction Factors

Monte Carlo Simulation Of Positron Induced Secondary Electrons In Thin Carbon Foils

Application of Monte Carlo simulation to cavity theory based on the virtual electron source concept

Advancements in Secondary and Backscattered Electron Energy Spectra and Yields Analysis: from Theory to Applications