A Novel Sub-50 Nm Poly-Si Gate Patterning Technology

SD Zhang,MS Chan,RQ Han,XY Liu,XD Guan,T Li,DC Zhang
DOI: https://doi.org/10.1109/tencon.2001.949712
2001-01-01
Abstract:A novel low-cost sub-50nm poly-Si gate patterning technology is proposed and experimentally demonstrated.The technology is resolution-independent,i.e.,it does not contain any critical photolithographic steps.The nano-scale masking pattern for gate formation is formed according to the image transfer of an edge-defined spacer.Experimental results reveal that the resultant gate length,about 75 to 85 percent of the thickness,is determined by the thickness of the film to form the spacer.From SEM photograph,the cross-section of the poly-Si gate is seen to be an inverted-trapezoid,which is useful to reduce the gate resistance.
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