CHARACTERIZATION AND ANALYSES OF THE CRYSTALLIZATION QUALITY AND PROPERTIES OF ACRT-VBM Hg1-xMnxTe CRYSTALS

LI Yujie,LIU Xiaohua,JIE Wanqi
DOI: https://doi.org/10.3321/j.issn:1005-3093.2000.04.008
2000-01-01
Abstract:Hg1-xMnxTe crystals of various diameters (5 mm and 15 mm respectively), grown by vertical bridgman method with accelerated crucible rotation technique (ACRT-VBM), were etched to assess the macroscopic and microscopic crystallization quality. Dislocations, Te-rich inclusions, grain boundary, and impurities were found and measured. In order to improve the electronic properties of the samples which are dominated by defects, slices of Hg1-xMnxTe crystals were annealed under low temperature (210-250°C). The electronic properties were evaluated by Hall measurement. Experimental results show that the conductivity type can be converted by annealing and the crystal defects, such as dislocation density and distribution, Te-rich inclusions and grain boundary could affect the electrical properties.
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