InP-based monolithic integration of 1.55 um MQW laser diode and HBT driver circuit

Xianjie Li,Fanghai Zhao,Qingming Zeng,Yi Dong,Xuhui Li,Shuren Yang,Keli Cai,Benzhong Wang,Jinping Ao,Chunguang Liang,Shiyong Liu
DOI: https://doi.org/10.1117/12.382891
2000-01-01
Abstract:An improved fabrication process and related experiment results of an InP-based monolithic integrated transmitter OEIC with a 1.55 um MQW laser diode (LD) and an InP/InGaAs heterojunction bipolar transistors (HBT) driver circuit are presented. The epitaxial structure of the laser and driver circuits were continuously grown on semi-insulating Fe-doped (100) InP substrate by a metal-organic chemical vapor deposition (MOCVD) system using a vertically integration. HCl, H3PO4/H2O2 and HBr/HNO3 solution system were involved as selective or nonselective wet chemical etching respectively for the epitaxies of InP, InGaAs and InGaPAs. Both a nearly-standard contact photolithography depending on a two-step exposure technique and an electrical connection related to smoothly wet chemical etching profile of InP and InGaP in the crystal direction of [01-1] were developed in the process. The laser diode with a 3-um-wide ridge waveguide forming by a double-groove process self-aligned to the metal contact of P-type region showed an average threshold current as low as about 10 mA. The HBT with a 120-nm-thick base layer performed a DC current gain of about 60-70 and an emitter-collector breakdown voltage of up to 4-5 V. A clear eye diagram of the monolithic transmitter under a pulsed operation with 622 Mbit/s bitrate nonreturn-to-zero pseudorandom code was obtained.
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