Quantum Confinement in InSb Microcrystallites Embedded in SiO 2 Thin Films

KG Zhu,JZ Shi,LD Zhang
DOI: https://doi.org/10.1088/0256-307x/15/2/024
1998-01-01
Abstract:Semiconductor InSb microcrystallites were embedded in SiO2 thin films by rf cosputtering technique. Structures of the thin films were characterized by transmission electron microscopy, x-ray diffraction, and x-ray photoelectron spectroscopy. Average size of the microcrystallites, depending on post-annealing temperature and time, is on the order of magnitude of nanometer. Absorption spectra of the films were measured and large blue shifts of absorption edge were observed in a wide range from 300 to 1500nm. The blue shifts were attributed to the quantum confinement effect and explained in the model of effective-mass approximation.
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