Metallographic study on the cross-sectional morphology of diamond film-substrate

Tongchun Kuang,Kesong Zhou,Mingjiang Dai,DeZheng Wang,ZhengYi Liu
1998-01-01
Abstract:Cross-sectional morphologies of chemical vapor deposited diamond thin films have been observed by means of MeF3 optical microscope with high resolution. The effect of methane concentration on the cross-sectional microstructure layers was mainly investigated. The results show that the surface microstructure of cemented carbide substrate are modified. The typical cross-sectional morphology of the diamond film-cemented carbide substrate is formed on the basis of pretreatment processes. The methane concentration has an obvious influence on the formation and thickness of above mentioned layers.
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