Non-relaxational Critical Current Density Measurement of Epitaxial Thin Films by Using an Improved A.c. Magnetization

ZM Ji,J Zhou,JP Zuo,GD Zhou,SZ Yang,QH Cheng,PH Wu,X Jin
DOI: https://doi.org/10.1088/0953-2048/10/12/020
1997-01-01
Abstract:Non-relaxational magnetic hysteresis loops of YBa2Cu3O7-delta (YBCO) thin films have been measured by an improved a.c. magnetization measurement with a.c. external field amplitude up to 1000 Oe and frequency range from 30 Hz-10 kHz at 77 K. Above a certain frequency (similar to 1000 Hz), the width of the magnetization hysteresis loop does not change with frequency, indicating that the magnetization can maintain a saturated state, namely the critical state. Experiments show that the critical current density deduced from the non-relaxational magnetic hysteresis loops is quite close to the value obtained by the four-probe measurement.
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