THE VARIATIONS OF INTERNAL RESIDUAL STRESS AND CRITICAL CURRENT INDUCED BY THICKNESS OF YBa_2Cu_3O_(7-δ) FILM

ZENG Lin,HAO Wen-jia,BAI Chuan-yi,LU Yu-ming,LIU Zhi-yong,GUO Yan-qun,CAI Chuan-bing
2012-01-01
Abstract:A series of YBa2Cu3O7-δ(YBCO) epitaxial films with different thicknesses(80 nm,320nm,1000nm and 2000 nm) are prepared by using pulsed laser deposition(PLD) and their critical current characteristics and internal residual stress are studied.Internal residual stress and critical current density for the films can be obtained by means of Laser Raman spectra and magnetic measurement.The result shows that the less residual stress,the higher Jc.The samples with moderate thickness(320nm and 1000nm) have higher Jc due to their less residual stress and higher liner defects density analysed by the result of their accommodation fields.
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