Microstructural Evolution with the Change in Thickness of Superconducting Films

Q. X. Jia,H. Wang,Y. Lin,Y. Li,C. Wetteland,G. W. Brown,M. Hawley,B. Maiorov,S. R. Foltyn,L. Civale,P. N. Arendt,J. L. MacManus-Driscoll
DOI: https://doi.org/10.1109/tasc.2007.898941
IF: 1.9489
2007-01-01
IEEE Transactions on Applied Superconductivity
Abstract:Microstructural evolution with the change in thickness of superconducting YBa2Cu3O7-X films on single-crystal SrTiO3 substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.
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